Signal Processing Device

ABSTRACT

There is provided a signal processing device comprising a combination unit ( 3 ) configured to combine plural element signals based on plural physical quantity signals including signal components in accordance with desired physical quantities, respectively, by the number of times equal to or greater than a number of the plural physical quantity signals, and to output combined signals different from each other; a measuring unit ( 4 ) configured to sequentially receive the combined signals output from the combination unit ( 3 ); and a computing unit ( 5 ) configured to compute signal components based on the desired physical quantities from signals that are generated based on the combined signals sequentially output from the measuring unit.

TECHNICAL FIELD

The present invention relates to a signal processing device.

BACKGROUND ART

In the related art, the time-sharing process (Time Sharing System) hasbeen adopted for processing plural analog signals.

To simply describe this signal processing system, this is a system forsequentially processing signals when one signal processing circuit suchas, for example, only one amplifier circuit or AD (i.e., Analog toDigital) converter is provided. During a certain time period, a firstanalog signal is processed; during a subsequent time period, a secondanalog signal is processed; and during a further subsequent time period,a third analog signal is processed.

Such processing is an extremely clear system, but, on the other hand, aprincipal problem is present. For example, during a time period in whichthe first analog signal is processed, no other analog signal can beprocessed. Accordingly, the greater the number of analog signals, thegreater will be the number of signals that are discarded without beingprocessed. As a result, a phenomenon with deterioration of an SN ratio(i.e., Signal to Noise Ratio) of the signal occurs.

As a measure for overcoming such a problem, there has been known what isdescribed in, for example, Patent Document 1. This measure isimplemented mainly for sensor signals such as analog signals, and has afeature that plural signals are linearly combined in differentcombinations.

Generally speaking, such a measure is a type of modulation mentionedabove and there exist only three types of modulating measures including“non-inverted signal” (i.e., the original sensor signal remainsunchanged), “non-signal”, and “inverted signal”. Further, these threetypes can be constructed of only switches, thereby making it possible toexpect a remarkable cost reduction and a reduction of power consumptionwhile simultaneously improving the SN ratio.

CITATION LIST Patent Literature

-   Patent Literature 1: WO 2008/032741

SUMMARY OF INVENTION Problems to be Solved

However, there is a demand to be suited for the type or the number ofsensors to be used.

The present invention has been made in view of the above-describedcircumstances, and the object of this invention is to provide a signalprocessing device that achieves an improved SN ratio and is suited forthe type and the number of sensors to be used.

Solution to Problem

According to one aspect of the present invention, there is provided asignal processing device including a combination unit (a combinationunit 3 illustrated in, for example, FIG. 1) configured to combine aplurality of element signals (output voltages V1 to V4 illustrated in,for example, FIG. 3) based on a plurality of physical quantity signals(the output voltages V1 to V4 illustrated in, for example, FIG. 3)including signal components in accordance with desired physicalquantities, respectively, by the number of times equal to or greaterthan a number of the plurality of physical quantity signals, and tooutput combined signals (for example, combined signals C1 to C4 outputfrom the combination unit 3) different from each other; a measuring unit(a measuring unit 4 as illustrated in, for example, FIG. 1) configuredto sequentially receive the combined signals output from the combinationunit; and a computing unit (a computing unit 5 as illustrated in, forexample, FIG. 1) configured to compute signal components based on thedesired physical quantities from signals that are generated based on thecombined signals sequentially output from the measuring unit.

The computing unit may linearly combine the combined signalssequentially output from the measuring unit, and computes the signalcomponents based on the desired physical quantities from results oflinear combination.

The conversion of the computing unit for linearly combining andconversion of the combination unit for defining the combined signals maybe inverse linear conversions from each other.

The number of the plurality of physical quantity signals may be equal toor greater than four.

The number of times the combination unit outputs the combined signalsmay be equal to the number of the plurality of physical quantitysignals, and the inverse linear conversions may have a relationship ofan inverse matrix from each other.

Specifically, “the relationships of an inverse matrix” herein mayinclude the inverse matrix and a constant factor of the inverse matrix.That is, assuming that “B” is an inverse matrix of a matrix “A”, “arelationship of an inverse matrix” described above may include therelationship between the matrix “A” and a matrix of “constantfactor×“B”” that is a constant multiple of the inverse matrix “B”.

The signal processing device may further comprise a signal invertingunit (for example, a signal inverting unit) configured to receive theplurality of physical quantity signals, to output a predetermined signalof the plurality of element signals respectively corresponding to thephysical quantity signals as an inverted signal in which a physicalquantity signal is inverted as an element signal, and to output aremaining signal of the plurality of element signals as a non-invertedsignal in which the physical quantity signal is not inverted as theelement signal, wherein the combination unit may combine the invertedsignal and the non-inverted signal by the number of times equal to orgreater than the number of the plurality of physical quantity signals.

The signal inverting unit may receive the plurality of physical quantitysignal: to perform an amplification process of amplifying one or moresignals of the plurality of physical quantity signals at a predeterminedamplification rate, and not amplifying or amplifying a remaining signalof the plurality of physical quantity signals at another amplificationrate different from the predetermined amplification; and to perform aninversion process of inverting the physical quantity signal of apredetermined signal of the plurality of physical quantity signals tobecome the inverted signal, and not inverting the physical quantitysignal of a remaining signal to become a non-inverted signal, whereinthe signal inverting unit may output signals of the plurality ofphysical quantity signals in which the amplification process and theinversion process are respectively performed, as the plurality ofelement signals, and wherein the combination unit may combine theplurality of element signals including the inverted signal of theplurality of element signals and the element signal including thenon-inverted signals of the plurality of element signals by the numberof times equal to or greater than the number of the plurality ofphysical quantity signals, and outputs the combined signals.

In addition, “amplification process”, as used herein, may include anoperation of amplifying one or more signals at a predeterminedamplification rate, does not change a remaining signal that is thephysical quantity signal, and amplifying one or more signals at apredetermined amplification rate and amplifying a remaining signal atanother amplification rate different from the predeterminedamplification rate.

Further, “inversion process” may include an operation of inverting thephysical quantity signal of a predetermined signal of the plurality ofphysical quantity signals to become the inverted signal, and notinverting the physical quantity signal of a remaining signal to become anon-inverted signal.

The signal inverting unit may amplify a signal having a minimum SN(Signal to Noise) ratio of the plurality of element signals respectivelycorresponding to the plurality of physical quantity signals at apredetermined amplification rate greater than 1.0 in an absolute value,and does not amplify or amplifies a remaining signal at anotheramplification rate having an absolute value smaller than the absolutevalue of the predetermined amplification rate.

The signal inverting unit may output a signal having a minimum SN ratioof the plurality of element signals respectively corresponding to theplurality of physical quantity signals without change, and amplifies aremaining signal at an amplification rate smaller than 1.0 in anabsolute value.

The number of the plurality of physical quantity signals may be equal toor greater than N, where N is an integer equal to or greater than 5, andthe signal inverting unit may invert and amplifies a predeterminedsignal by ((N/2)−1) times to become the inverted signal.

The computing unit may compute a signal component based on the desiredphysical quantity based on linearly combined data in which the combinedsignal output from the combination unit and a given coefficient arelinearly combined, and the coefficient may not include 0 and has theabsolute values all of which are equal.

The plurality of physical quantity signals may include signals outputfrom at least two types of sensors for measuring different physicalquantities.

The plurality of physical quantity signals may include signals outputfrom two or more sensors, and the two or more sensors include a sensorhaving at least one of sensitivity and the SN ratio different from thesensitivity or the SN ratio of the other sensor.

According to another aspect of the present invention, there is provideda plurality of resistance type sensors (resistance type sensors 31-1 to31-4 as illustrated in, for example, FIG. 19) configured to detectpredetermined physical quantities, and having resistances varyingdepending on detected physical quantities; a detection circuit formingunit (a detection circuit forming unit 32 as illustrated in, forexample, FIG. 19) configured to select two or more predeterminedresistance type sensors from the plurality of resistance type sensors,and to form a predetermined resistance detection circuit (a half-bridgecircuit or a full-bridge circuit as illustrated in, for example, FIG.29) including the two or more resistance type sensors that have beenselected; a measuring unit (a measuring unit 33 as illustrated in, forexample, FIG. 19) configured to sequentially receive output signals fromthe resistance detection circuit that has been formed; and a computingunit (a computing unit 34 as illustrated in, for example, FIG. 19)configured to compute, including an operation of linearly combining theoutput signals sequentially output from the measuring unit to computethe physical quantities.

The detection circuit forming unit may select two or more resistancetypes that are different for each time period from the plurality ofresistance type sensors, and forms the predetermined resistancedetection circuit including the two or more resistance type sensors thathave been selected.

The plurality of resistance type sensors may include three or moreresistance type sensors.

The detection circuit forming unit may select two or more resistancetype sensors that detect predetermined physical quantities independentfrom each other from the plurality of resistance type sensors, and formsthe predetermined resistance detection circuit including the two or moreresistance type sensors that have been selected.

The two or more resistance type sensors that have been selected may besensors that simultaneously detect either physical quantities of two ormore axes orthogonal to each other or two or more types of physicalquantities and change resistances depending on detected values.

The computing unit may compute components of the predetermined physicalquantities on either two axes orthogonal to each other or three axes.

The predetermined physical quantities may be magnetic fields.

The resistance detection circuits may be made of either half-bridgecircuits or full-bridge circuits, and the detection circuit forming unitmay alternately form the half-bridge circuits and the full-bridgecircuits.

The computing unit may linearly combine the output signals from theresistance detection circuits sequentially received by the measuringunit and coefficients corresponding to the output signals from theresistance detection circuits to generate linearly combined data.

Advantageous Effects of Invention

According to an aspect of the present invention, it becomes possible toprovide a signal processing device suited for the type and the number ofsensors in use while achieving the improvement of an SN ratio.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram illustrative of a configuration example ofembodiment 1 of a signal processing device according to the presentinvention;

FIG. 2 is a circuit diagram illustrative of a configuration example of asensor and switches;

FIG. 3 is a block diagram illustrative of a configuration of a casewherein embodiment 1, illustrated in FIG. 1, adopts sensors of voltageoutput types having two terminals;

FIG. 4 is a timing chart for illustrating operation of embodiment 1;

FIG. 5 is a block diagram of a case where noise is superimposed inembodiment 1 illustrated in FIG. 3 with a view to studying noise;

FIG. 6 is one example of a block diagram illustrative of an overallconfiguration of embodiment 2 of a signal processing device according tothe present invention;

FIG. 7 is a circuit diagram illustrative of configuration examples ofswitches of FIG. 6;

FIG. 8 is a block diagram illustrative of a configuration example ofembodiment 2, illustrated in FIG. 6, wherein a part is extracted withthis configuration example corresponding to comparative example 2;

FIG. 9 is a timing chart for illustrating operation of FIG. 8;

FIG. 10 is a block diagram illustrative of a configuration example ofembodiment 2, illustrated in FIG. 6, in which a part is extracted withthis configuration example being correlated to embodiment 2 according tothe present invention;

FIG. 11 is a circuit diagram illustrative of a configuration example ofa signal amplifying circuit of FIG. 10;

FIG. 12 is a timing chart for illustrating comparative example 1;

FIG. 13 is an illustrative view for illustrating calculation results ofSN ratios under a situation where in embodiment 2 of FIG. 10, not onlysignals of the sensors but also the magnitude of noises are different;

FIG. 14 is a block diagram of a modification to embodiment 2 accordingto the present invention;

FIG. 15 is a block diagram illustrative of a configuration example ofembodiment 3 of a signal processing device according to the presentinvention;

FIG. 16 is one example of a block diagram including a concrete circuitillustrative of a configuration in a case wherein embodiment 3,illustrated in FIG. 15, adopts sensors of voltage output types havingtwo terminals;

FIG. 17 is one example of a timing chart illustrative of how switches ofa signal inverting unit perform switching operations in embodiment 3illustrated in FIG. 15;

FIG. 18 is a block diagram of a case where noise is superimposed inembodiment 3 illustrated in FIG. 15 with a view to studying noise;

FIG. 19 is a block diagram illustrative of a configuration of embodiment4 of a signal processing device according to the present invention;

FIG. 20A is one example of a circuit diagram in a phase 1 of aresistance detection circuit formed in a detection circuit forming unitof FIG. 19;

FIG. 20B is one example of a circuit diagram in a phase 2 of theresistance detection circuit formed in the detection circuit formingunit of FIG. 19;

FIG. 20C is one example of a circuit diagram in a phase 3 of theresistance detection circuit formed in the detection circuit formingunit of FIG. 19; and

FIG. 20D is one example of a circuit diagram in a phase 4 of theresistance detection circuit formed in the detection circuit formingunit of FIG. 19.

DESCRIPTION OF EMBODIMENTS

Next, embodiments of the present invention will be described below withreference to the accompanying drawings.

First, embodiment 1 will be described.

Configuration of Embodiment 1

FIG. 1 is a block diagram illustrative of a configuration example ofembodiment 1 of a signal processing device according to the presentinvention.

As illustrated in FIG. 1, the signal processing device of embodiment 1includes four sensors 1-1 to 1-4, a signal inverting unit 2 having fourswitches 2-1 to 2-4, a combination unit 3, a measuring unit 4, and acomputing unit 5.

The four sensors 1-1 to 1-4 respectively convert physical quantitiesinto electrical signals to be output as output signals. The types ofthese sensors 1-1 to 1-4 are not limited and any type of sensorsdifferent from each other can be used. In the following description, itis supposed that the sensors 1-1 to 1-4 have configurations includingsensor sensitive parts each having both ends provided with electrodeterminals, that is, two-terminal type sensors.

The four switches 2-1 to 2-4 are provided in association with the foursensors 1-1 to 1-4, respectively. That is, the switches 2-1 to 2-4 areconnected to the associated sensors 1-1 to 1-4, respectively, and havesimilar functions.

As illustrated in, for example, FIG. 2, the switch 2-1 includes twochangeover switches 2-1A and 2-1B connected to output sides of thesensor 1-1. Therefore, the two changeover switches 2-1A and 2-1B performswitching operations, so that an output signal of the sensor 1-1 can beinverted and output as an inverted signal or the output signal cannot beinverted such that the output signal is output as a non-inverted signalwithout change. The switches 2-2 to 2-4 are connected to the sensors 1-2to 1-4 and have the same functions with the function of the switch 2-1.

FIG. 2 represents a case where the output signal of the sensor 1-1 isinverted by the switch 2-1, and the switch 2-1 outputs an invertedsignal.

The combination unit 3 generates combined signals C1 to C4 by seriallyconnecting (i.e., combining) respective output signals S1 to S4 outputfrom the switches 2-1 to 2-4. Alternately, the combined signals C1 to C4are generated by connecting these output signals S1 to S4 in parallel.

Here, when the sensors 1-1 to 1-4 are configured as the two-terminaltype sensors, there are, for example, voltage output types and currentoutput types. Therefore, when the sensors 1-1 to 1-4 are configured asthe voltage output types, the combined signals are generated with therespective output signals connected in series. In the case of thecurrent output types, the combined signals are generated with therespective output signals connected in parallel.

Further, when the sensors 1-1 to 1-4 are configured as other outputtypes, that is, for example, capacitive types or resistive types,electric circuits may be provided for converting values into voltages orcurrents.

The measuring unit 4 sequentially receives the combined signals C1 to C4that are generated by the combination unit 3 in synchronization withopening and/or closing operations of the switches 2-1 to 2-4. Thesecombined signals C1 to C4 are subjected to a predetermined process suchas an amplification or AD conversion.

The computing unit 5 performs predetermined computations to linearlycombine the combined signals C1 to C4 to be received by the measuringunit 4 and subsequently subjected to a predetermined process. Under suchlinear combination, the predetermined computations are performed forobtaining respective output values of the sensors 1-1 to 1-4 andcomputation results are output.

Computing operations of the computing unit 5 for the respective outputvalues of the sensors 1-1 to 1-4 may be realized by a CPU (CentralProcessing Unit) or a computer using software or the like.

Next, configurations of specific examples from the sensors 1-1 to 1-4 tothe measuring unit 4 of FIG. 1 will be described with reference to FIG.3.

FIG. 3 is a block diagram illustrative of a configuration in whichembodiment 1 of FIG. 1 adopts voltage output type sensors with twoterminals as the sensors 1-1 to 1-4.

The signal processing device of embodiment 1 includes the four sensors1-1 to 1-4, a signal inverting unit 2A, the measuring unit 4, and thecomputing unit 5.

Embodiment 1 represents the configuration, corresponding to the signalinverting unit 2 and the combination unit 3 of embodiment 1 illustratedin FIG. 1, which is embodied by using the signal inverting unit 2A asillustrated in FIG. 3.

The signal inverting unit 2A permits the switching operations of theswitches 2-1 to 2-4. The switches 2-1 to 2-4 generate the invertedvoltages and the non-inverted voltages by inverting or non-inverting theoutput voltages V1 to V4 of the sensors 1-1 to 1-4, which areselectively output.

Further, the signal inverting unit 2A serially combines the invertedvoltages or the non-inverted voltages selectively output from theswitches 2-1 to 2-4, respectively, such that voltages P1 to P4 aregenerated. The voltages P1 to P4 are sequentially output from bothterminals of the switches 2-1 to 2-4.

More particularly, the switch 2-1 includes changeover switches 2-1A and2-1B, which are switched to selectively output the inverted voltage andthe non-inverted voltage, resulting from inverting or non-inverting theoutput voltage V1 of the sensor 1-1. Further, the switch 2-2 includeschangeover switches 2-2A and 2-2B, which are switched to selectivelyoutput the inverted voltage and the non-inverted voltage by inverting ornon-inverting the output voltage V2 of the sensor 1-2.

Furthermore, the switch 2-3 includes changeover switches 2-3A and 2-3B,which are switched to selectively output the inverted voltage and thenon-inverted voltage by inverting or non-inverting the output voltage V3of the sensor 3. Moreover, the switch 2-4 includes changeover switches2-4A and 2-4B, which are switched to selectively output the invertedvoltage and the non-inverted voltage by inverting or non-inverting theoutput voltage V4 of the sensor 4.

Further, the switches 2-1 to 2-4 are connected in series as illustratedin FIG. 3 to serially combine the inverted voltages or the non-invertedvoltages selectively output from the switches 2-1 to 2-4 so as togenerate the voltages P1 to P4.

Here, an example of FIG. 3 is a case where the output voltage V1 of thesensor 1-1 is inverted by the switch 2-1. The switch 2-1 outputs aninverted voltage −V1. The respective output voltages V2 to V4 of thesensors 1-2 to 1-4 is not inverted by the switches 2-2 to 2-4. Theswitches 2-2 to 2-4 output the non-inverted voltages V2, V3, and V4.Therefore, the output voltages of the signal inverting unit 2A are givento be (−V1+V2+V3+V4).

The measuring unit 4 sequentially receives the voltages P1 to P4generated by the signal inverting unit 2A in synchronization with theopening and closing operations of the switches 2-1 to 2-4 for performingamplifications and AD conversions. To this end, the measuring unit 4includes an amplifying unit 4-1 and an AD converting unit 4-2 asillustrated in FIG. 3.

The computing unit 5 performs predetermined computations to linearlycombine the voltages P1 to P4 of output data output from the ADconverting unit 4-2. Under such linear combination, predeterminedcomputations are performed to obtain respective output values of thesensors 1-1 to 1-4 and computation results are output.

Operation of Embodiment 1

Next, an operation example of embodiment 1 will be described withreference to FIG. 3 and FIG. 4.

It is supposed that in FIG. 3, the switches 2-1 to 2-4 of the signalinverting unit 2A perform the switching operations in response tocontrol signals given from a control unit (not illustrated).

The switches 2-1 to 2-4 have first to fourth operating states, asillustrated in FIG. 4, and respective operations are performed duringfirst to fourth periods T1 to T4.

First, during the first period T1, the switches 2-1 to 2-4 of the signalinverting unit 2A have the operating states as illustrated in FIG. 3.

Therefore, the voltage obtained by the switch 2-1 is the invertedvoltage −V1 of the sensor 1-1. Moreover, the respective voltagesobtained by the switches 2-2 to 2-4 are the non-inverted voltages V2,V3, and V4 of the sensors 1-2 to 1-4.

Thus, the voltages obtained by the switches 2-1 to 2-4 have values of −1time, +1 time, +1 time, and +1 time the output voltages V1 to V4 of thesensor 1-1. In FIG. 4, a non-inverted output of the switch is indicatedby “+1” and an inverted output of the switch is indicated by “−1”.

Accordingly, when during the first period T1, P1 is the output voltageoutput from the signal inverting unit 2A and processed at the measuringunit 4 and subsequently output from the AD converting unit 4-2 of themeasuring unit 4, the output voltage P1 is proportional to(−V1+V2+V3+V4).

Next, during the second to fourth periods T2 to T4, the switches 2-1 to2-4 of the signal inverting unit 2A take the operating states in whichthe respective voltages are obtained as follows (see FIG. 4).

That is, during the second period T2, the non-inverted voltages V1, theinverted voltage −V2, and the non-inverted voltages V3 and V4 areobtained from the switches 2-1 to 2-4. During the third period T3, thenon-inverted voltages V1 and V2, an inverted voltage −V3 and anon-inverted voltage V4 are obtained from the switches 2-1 to 2-4.During the fourth period T4, the non-inverted voltages V1, V2, and V3and an inverted voltage −V4 are obtained from the switches 2-1 to 2-4.

Suppose that the output voltages, output from the AD converting unit 4-2of the measuring unit 4, are P1 to P4 during the periods T1 to T4,respectively, the output voltages P1 to P4 are given by the followingequations (1) to (4).

P1=−V1+V2+V3+V4  (1)

P2=V1−V2+V3+V4  (2)

P3=V1+V2−V3+V4  (3)

P4=V1+V2+V3−V4  (4)

From these four equations, the computing unit 5 is capable of inverselyobtaining the output voltages V1 to V4 of the sensors 1-1 to 1-4, and,in particular, this can be given by the following equations.

V1=¼·(−P1+P2+P3+P4)  (5)

V2=¼·(P1−P2+P3+P4)  (6)

V3=¼·(P1+P2−P3+P4)  (7)

V4=¼·(P1+P2+P3−P4)  (8)

According to embodiment 1, thus, it becomes possible to obtain therespective output voltages of the four sensors 1-1 to 1-4.

Next, a study will be conducted as to how much the SN ratio is improvedin embodiment 1.

FIG. 5 illustrates a case where noise (i.e., disruptive noise) issuperimposed on a measuring system of FIG. 3.

It is supposed that this noise takes noise with a fixed value againstwhite noise, that is, against all frequency bands, and that a noisevalue is expressed as ±N. In addition, it is supposed that all of thefour sensors have noises with the same magnitude of ±Ns which aremutually uncorrelated.

Meanwhile, it is supposed that noise generated by the signal invertingunit 2A is extremely small and ignored (i.e., with no noise) and thatnoise of the amplifying unit 4-1 of the measuring unit 4 is determinedto be ±Na. Moreover, it is supposed that noise of the amplifying unit4-2 of the measuring unit 4 is ignored.

Then, the output voltages P1 to P4 of the AD converting unit 4-2 aregiven as follows:

P1=−(V1±Ns)+(V2±Ns)+(V3±Ns)+(V4±Ns)±Na  (9)

P2=(V1±Ns)−(V2±Ns)+(V3±Ns)+(V4±Ns)±Na  (10)

P3=(V1±Ns)+(V2±Ns)−(V3±Ns)+(V4±Ns)±Na  (11)

P4=(V1±Ns)+(V2±Ns)+(V3±Ns)−(V4±Ns)±Na  (12)

Here, since noises of the sensors 1-1 to 1-4 are uncorrelated to eachother, the above four equations are simplified as follows.

P1=−V1+V2+V3+V4±2Ns±Na  (13)

P2=V1−V2+V3+V4±2Ns±Na  (14)

P3=V1+V2−V3+V4±2Ns±Na  (15)

P4=V1+V2+V3−V4±2Ns±Na  (16)

These four equations are subjected to the same computations as thoseperformed for the V1 to V4 of the above equations (5) to (8). When theoutput V1 of the sensor 1-1 needs to be obtained, ¼·(−P1+P2+P3+P4) isonly to be calculated. Even in the equations (13) to (16), only an itemof V1 remains and V2, V3, and V4 disappear.

Further, the output voltages P1 to P4 of the AD converting unit 4-2 aremeasured in different time periods and, basically, sensor noises andamplifying noises are uncorrelated to the measuring time periods witheach other.

Accordingly, an output V1′ of the sensor 1-1, with noise taken intoconsideration, is given by the following equation.

V1′=V1±Ns±½·=Na  (17)

This demonstrates that the amplifying unit 4-1 has a noise level reducedby ½, as compared to the output V1±Ns±Na occurring during thetime-sharing process, and thus the S/N ratio is improved.

With noises taken into consideration, outputs V2′ to V4′ of the othersensors 1-1 to 1-4 are similarly provided to be given by the followingequations.

V2′=V2±Ns±½·Na  (18)

V3′=V3±Ns±½·Na  (19)

V4′=V4±Ns±½·Na  (20)

Therefore, all the S/N ratios can be improved.

In particular, when supposed that the sensors 1-1 to 1-4 have noises ±Nsthat are extremely small in magnitude that can be ignored as compared tonoise ±½·Na of the amplifying unit 4-1, embodiment 1 is capable ofexhibiting the maximum effect.

A whole of the foregoing descriptions have been made for the specifiedcase demonstrated by the timing chart of FIG. 4. Now a description willbe given of plural cases that can exhibit the same effect as thosementioned above and a theory by which such plural cases can be led.

For the sake of convenience of description, first, states of theswitches 1-1 to 1-4 of FIG. 4 are provided in matrix representation.Suppose this matrix is S, which is expressed as follows.

$\begin{matrix}{S = \begin{pmatrix}{- 1} & {+ 1} & {+ 1} & {+ 1} \\{+ 1} & {- 1} & {+ 1} & {+ 1} \\{+ 1} & {+ 1} & {- 1} & {+ 1} \\{+ 1} & {+ 1} & {+ 1} & {- 1}\end{pmatrix}} & ( {{Expression}\mspace{14mu} 1} )\end{matrix}$

This matrix S represents temporary changes of the states of the switches2-1 to 2-4 for the respective sensors 1-1 to 1-4 in terms of +1 (i.e.,non-inverted) or −1 (i.e., inverted) as mentioned above. When focusingon the matrix, it can be said that the states of the switches for thesensors 1-1 to 1-4 are demonstrated in terms of the respective measuringtime periods.

On the other hand, an inverse matrix S⁻¹ is given as follows.

$\begin{matrix}{S^{- 1} = {\frac{1}{4}\begin{pmatrix}{- 1} & {+ 1} & {+ 1} & {+ 1} \\{+ 1} & {- 1} & {+ 1} & {+ 1} \\{+ 1} & {+ 1} & {- 1} & {+ 1} \\{+ 1} & {+ 1} & {+ 1} & {- 1}\end{pmatrix}}} & ( {{Expression}\mspace{14mu} 2} )\end{matrix}$

The inverse matrix S⁻¹ indicates a matrix in which coefficients of theabove equations (5) to (8) are arranged.

This is a natural result in a linear algebra theory.

Hereinafter, for the sake of convenience, the above-noted matrix S iscalled switch matrix, and the above-noted inverse matrix S⁻¹ is calledcomputation matrix and, with a view to deriving an optimum method, bothof the matrixes are provided in a generalized display as follows.

$\begin{matrix}{{S = \begin{pmatrix}{a\; 11} & {a\; 12} & {a\; 13} & {a\; 14} \\{a\; 21} & {a\; 22} & {a\; 23} & {a\; 24} \\{a\; 31} & {a\; 32} & {a\; 33} & {a\; 34} \\{a\; 41} & {a\; 42} & {a\; 43} & {a\; 44}\end{pmatrix}}{S^{- 1} = \begin{pmatrix}{b\; 11} & {b\; 12} & {b\; 13} & {b\; 14} \\{b\; 21} & {b\; 22} & {b\; 23} & {b\; 24} \\{b\; 31} & {b\; 32} & {b\; 33} & {b\; 34} \\{b\; 41} & {b\; 42} & {b\; 43} & {b\; 44}\end{pmatrix}}} & ( {{Expression}\mspace{14mu} 3} )\end{matrix}$

As indicated by the matrix, the switch matrix S has sixteen elements(i.e., parameters) from a11 to a44.

Here, the following condition is listed as a precondition 1 ofembodiment 1 according to the present invention.

“Precondition 1: each element of the switch matrix S is either +1 or−1.”

This precondition results from the fact that the states of the switchesare limited to be non-inverted (+1) or inverted (−1). Such a limitationis made for a reason as will be described below.

It is not always impossible to allow the above element to take anarbitrary numeral (such as, for example, −2 or +10) by using a generalelectric circuit. However, when attempt is made to be set to −2, thismeans that a signal is inverted by 2 times and an amplifier circuit isnaturally needed. Also, such amplifications need to be suitablyperformed for respective one of the four sensors. This similarly appliesto a case of an example with +10. On the other hand, it is possible for+1 and −1 to be made of only the switches. Consequently, a circuitconfiguration can be remarkably compressed.

Further, as a value of the element made of only the switches, a value of0 (zero) can be taken. This is a general time-sharing signal processingmethod (or a method simply on an extended line), and has no contributionto the improvement of the SN ratio that is an object of the presentinvention. Accordingly, only +1 and −1 are values of the elements thatcan achieve both the compression of the circuit configuration and theimprovement of SN ratio.

However, even when the above limitation is made, it is conceived thatthere are still matrixes of 16-power of 2 patterns, that is, 65536patterns.

The next precondition 2 represents a condition under which the aboveequations (5) to (8) can be computed.

“Precondition 2: the switch matrix S has to have the inverse matrix S.”

The precondition 2 can be mentioned in other words as follows by usingthe linear algebra theory.

“Precondition 2′: a matrix expression of the switch matrix S must not be0 (zero).”

This precondition results from the fact that such a precondition is onlyeffective to a case where the present invention is capable of obtaininga computing matrix (i.e., the inverse matrix of the switch matrix) byusing the equations (5) to (8). Accordingly, the 65536 patterns arereduced to 22272 patterns.

Subsequently, for the purpose of determining precondition 3, the abovecomputing matrix S⁻¹ is partially extracted and studied. Extracting onlythe uppermost line from the computing matrix S⁻¹ to indicate the sameequation as that of the equation (5), this is given as follows.

V1=b11·P1+b12·P2+b13·P3+b14·P4  (21)

In the above equation, it is assumed that b11=0 is satisfied. b11=0means that even when the output P1 from the AD converting unit 4-2 is aneffective signal, such a signal is never utilized. Mathematicallyspeaking, the signal component can be reduced by three quarters (0.75times) with respect to the preceding special case. Accordingly, itcannot be said to be an optimum determining condition for the purpose ofimproving the SN ratio.

Next, a study will be conducted as to a case where the followingcondition is applied as precondition 3.

“Precondition 3: each element of the computing matrix is either +¼ or−¼.”

Here, ±¼ indicates a numeric value that is fixed because the computingmatrix S⁻¹ is defined to be the inverse matrix of the switch matrix S.In actual applications, as indicated above, a proportional coefficientof the output from the AD converting unit 4-2 can be arbitrarilyobtained. Thus, the condition may be more loosely set than thatmentioned above to be expressed below,

“Precondition 3′: each element in the computing matrix S⁻¹ is either +cor −c (provided that c≠0)” or

“Precondition 3″: all of the elements in the computing matrix S⁻¹ arenot zero and all of respective absolute values are equal.”

Even the above conditions will not lose generality.

The case number of the switch matrix S for satisfying this drasticallyreduces from 22272 patterns to 384 patterns (384 patterns are applied toall of preconditions 3, 3′, and 3″ in the same manner).

That is, 384 patterns is the case number where the switch matrix Sexhibits the maximum effect according to the present invention.

As is apparent from the foregoing considerations, however, all of these384 patterns provide the same effect of improving the SN ratio, and, inactual applications, one of 384 patterns can be suitably selected.

When studying a factor that can provide the same effect as those notedabove in terms of an algebraic viewpoint, for example, theabove-described 384 patterns include the following switch matrix S′.

$\begin{matrix}{S^{\prime} = \begin{pmatrix}{- 1} & {- 1} & {+ 1} & {- 1} \\{+ 1} & {+ 1} & {+ 1} & {- 1} \\{- 1} & {+ 1} & {- 1} & {- 1} \\{- 1} & {+ 1} & {+ 1} & {+ 1}\end{pmatrix}} & ( {{Expression}\mspace{14mu} 4} )\end{matrix}$

However, the switch matrix S′ can be restored to thepreviously-mentioned switch matrix S by performing the followingoperations.

Operation 1: multiply a first row and a third row by a factor of −1,respectively.

Operation 2: replace a fourth row to the first row, the third row to thesecond row, the first row to the third row, and the second row to thefourth row.

According to the present invention, in the operation 1, all of thenon-inverted or inverted switching states are inversed. Such a meremodification gives no affect to the SN ratio. In addition, the operation2 merely changes the numbering of the sensors and no generality is lostat all. By considering in the same manner, all of the 384 patterns canbe theoretically returned to the switch matrix S mentioned above.

Moreover, as described above, the maximum effect of the presentinvention is to improve the SN ratio for the time-sharing process. Tomention in such a sense, as described above, the switch matrix S maytake any form as long as “each of the elements of the computing matrixS-1 is not zero and the respective absolute values are equal.”

That is, it is necessary to pay attention to what is to be naturallyapplied in advance as a precondition is the computing matrix S. Inparticular, it is an extremely effective method to apply the sametechnique as that of the present invention to more than four (i.e.,equal to or greater than five) sensors. The description heretofore hasbeen provided for clarity of the technical content of the presentinvention with attention especially focused on the four sensors.

Incidentally, applying the conditions up to precondition 3 demonstratesthat the switch matrix S and the computing matrix S⁻¹ are present in 384patters. Hereinafter, description is made of how the optimum matrix isfurther selected from the 384 patterns depending on the type of sensorsignals.

The 384 patterns also include the following switch matrix S″ that isdifferent from the preceding switch matrixes S and S′.

$\begin{matrix}{S^{''} = \begin{pmatrix}{- 1} & {- 1} & {- 1} & {- 1} \\{- 1} & {- 1} & {+ 1} & {+ 1} \\{- 1} & {+ 1} & {- 1} & {+ 1} \\{- 1} & {+ 1} & {+ 1} & {- 1}\end{pmatrix}} & ( {{Expression}\mspace{14mu} 5} )\end{matrix}$

For the switch matrix S″, the following operations are performed in thesame ways as those for the switch matrix S′ mentioned above.

Operation 1: multiply the first row by a factor of −1.

Operation 2: multiply the first row by a factor of −1 after theoperation 1.

Upon performing the operations in these two stages, the switch matrix Sis restored as described above.

Focusing on the first row of the switch matrix S″, however, all of thevalues of the elements are −1 without including +1. Meanwhile, thesecond to fourth rows have the elements having values of both +1 and −1.This has the following meaning. That is, even when both the matrixes arecoequal in view of the linear algebraic theory, signal processing ofembodiment 1 of the present invention is performed. When this takesplace, there exists a case where the second to fourth sensors havepositive and negative orientations different from each other. Incontrast, only the first sensor has the same orientation at all times(with the switch matrix S″ being inverted at all times). Accordingly, itcannot be said that these matrixes are coequal in light of signalprocessing.

Therefore, by focusing on signal characteristics of the respectivesensors, for example, the switch matrix S (or the switch matrix S′) andthe switch matrix S″ can be selectively used as follows.

(1) “A case where all of the types (i.e., signal characteristics) of thefour sensors are the same” or “a case where even though the four sensorsbelong to the different types, similar signal processing may bepreferably performed.”

In such cases, it is preferable for the four sensors to be symmetricalto each other in temporal change of the switches. Consequently, theswitch matrix S or the witch matrix S′ are recommended. In this case,there are 96 patterns from among the 384 patterns noted above.

(2) “A case where among the four sensors, three sensors are same but onesensor is different” or “a case where among the four sensors, only onesensor has extremely small impedance”.

In such cases, it is preferable not to provide the switch for one sensorthat is different. Accordingly, the switch matrix S″ is recommended. Insuch a case, there are 288 patterns.

Modification to Embodiment 1

(1) Although the signal processing device of embodiment 1, illustratedin FIG. 3, belongs to a case where the sensors 1-1 to 1-4 are of thevoltage output types having the two terminals, the sensors 1-1 to 1-4may be replaced with current output types having two terminals.

In this case, the sensors 1-1 to 1-4 and the associated switches 2-1 to2-5 are connected in a way similar to FIG. 3, but mutual connectionsbetween the switches 2-2 to 2-4 are modified from the serial connectionsillustrated in FIG. 3 to parallel connections.

(2) Although the signal processing device of embodiment 1 as illustratedin FIG. 1 and FIG. 3 has been described of four sensors, but two sensorsmay be provided.

In the case where two sensors are provided, the same discussions asthose noted above demonstrate that the SN ratio can be further improvedthan that of the related art by 2 times. This is accomplished byselecting a matrix, which is indicated by the following Expression 6, asthe switch matrix S and selecting a matrix, which is indicated by thefollowing expression 7, as the computing matrix S.

$\begin{matrix}{S = \begin{pmatrix}{+ 1} & {+ 1} \\{+ 1} & {- 1}\end{pmatrix}} & ( {{Expression}\mspace{14mu} 6} ) \\{S^{- 1} = {\frac{1}{2}\begin{pmatrix}{+ 1} & {+ 1} \\{+ 1} & {- 1}\end{pmatrix}}} & ( {{Expression}\mspace{14mu} 7} )\end{matrix}$

Next, embodiment 2 will be described.

Embodiment 2 is related to a signal processing device that makes itpossible to relatively increase an SN ratio of a sensor signal having asmall SN ratio.

Configuration of Embodiment 2

FIG. 6 is a block diagram illustrative of an overall configuration ofthe signal processing device of embodiment 2.

As illustrated in FIG. 6, the signal processing device of embodiment 2includes: three acceleration sensors (i.e., an X-axis accelerationsensor, a Y-axis acceleration sensor, and a Z-axis acceleration sensor)11-1 to 11-3, three magnetic sensors (i.e., an X-axis magnetic sensor, aY-axis magnetic sensor, and a Z-axis magnetic sensor) 11-4 to 11-6, asignal amplifying unit 12, a signal inverting unit 13, a combinationunit 14, a measuring unit 15, and a computing unit 16. The signalinverting unit 13 includes the signal amplifying unit 12 for amplifyingoutputs given from the sensors, and six switches 13-1 to 13-6 forinverting signals.

According to embodiment 2, the three acceleration sensors 11-1 to 11-3and the three magnetic sensors 11-4 to 11-6 will be collectivelyreferred to as a six-axis electronic compass.

As will be apparent from the following description, the number of thesensors is not limited to six and may be equal to or greater than two.In addition, the type of the sensors is not limited to the accelerationsensor or the magnetic sensor, and any number of sensor types may beprovided as long as the sensor types are equal to or greater than two.Moreover, as will be described later, one type of the sensor may beprovided.

The signal amplifying unit 12 amplifies an output signal of at least onepredetermined sensor of the sensors 11-1 to 11-6, and then the amplifiedoutput signal is output. Further, “signal amplification”, which is usedin the present specification, may include the amplification of thesignal to be less than 1.0 time, that is, the attenuation of the signal.Furthermore, the signal amplifying unit 12 does not amplify the outputsignal of at least one predetermined sensor of the sensors 11-1 to 11-6,and is output without amplification. To this end, the signal amplifyingunit 12 includes a signal amplifier circuit, as will be described below.

Here, the signal amplifier circuit may be of an amplification rate thatis preliminarily determined or of a variable type that can arbitrarilydetermine the amplification rate.

The switches 13-1 to 13-6 are respectively provided in association withthe sensors 11-1 to 11-6. That is, the switches 13-1 to 13-6 areconnected to the associated sensors 11-1 to 11-6 via the signalamplifying unit 12, respectively, and have functions similar to eachother.

The switches 13-1 to 13-6 take the same configurations, respectively,and among these, a configuration example of the switch 13-1 isillustrated in FIG. 7.

As illustrated in FIG. 7, for example, the switch 13-1 has two inputterminals 1301 and 1302, two output terminals 1303 and 1304, and twochangeover switches 13-1A and 13-1B.

In this example, the signal amplifying unit 12 amplifies the outputsignal of the sensor 11-1 to provide differential outputs, which areapplied as differential inputs (a P-input and an N-input) to the inputterminals 1301 and 1302. However, when the signal amplifying unit 12does not amplify the output signal of the sensor 11-1, the output signalof the sensor 11-1 is applied without change to the input terminals 1301and 1302.

In the switch 13-1 of such a configuration, the changeover switches13-1A and 13-1B perform switching operations. This causes thedifferential input signals, applied to the input terminals 1301 and1302, to be inverted to provide inverted signals or not to be invertedto provide non-inverted signals without change, which are output fromthe output terminals 1303 and 1304.

That is, when the differential input signals are inverted and thenoutput, a changeover contact of the switch 13-1A is connected to acontact “b” and a changeover contact of the switch 13-1B is connected toa contact “a”. Meanwhile, when the differential input signals are outputwithout inversions, the changeover contact of the switch 13-1A isconnected to the contact “a” and the changeover contact of the switch13-1B is connected to the contact “b”.

The combination unit 14 generates combined signals by seriallyconnecting (i.e., combining) the output signals from the switches 13-1to 13-6, or generates combined signals by connecting the output signalsin parallel. When the sensors 11-1 to 11-6 are configured with thetwo-terminal type sensors, here, there are, for example, a voltageoutput type and a current output type. Therefore, when the sensors 11-1to 11-6 are of the voltage output types, the respective output signalsare combined in series to generate the combined signals, whereas in thecase of the current output types, the respective output signals arecombined in parallel to generate the combined signals.

Further, when the sensors 11-1 to 11-6 are configured with anotheroutput type, such as, for example, a capacitor type or a resistor type,any type of electric circuit may be provided as long as it converts theminto voltages or currents.

The measuring unit 15 sequentially receives the combined signalsgenerated by the combination unit 14 in synchronization with opening andclosing operations of the switches 13-1 to 13-6, and performs apredetermined process such as amplification or AD conversion.

The computing unit 16 linearly combines the combined signal byperforming predetermined computation on the combined signal which hasbeen received and then a predetermined process has been performed by themeasuring unit 15. Under such linear combination, predeterminedcomputations are performed to obtain the respective output values of thesensors 11-1 to 11-6 and computation results are output. The computingprocess of the computing unit 16 for the respective output values of thesensors 11-1 to 11-6 can be achieved by a CPU (Central Processing Unit)or software or the like using a computer.

Operation of Embodiment 2

Next, the operation of embodiment 2 of such a configuration will bedescribed.

Although embodiment 2 includes the signal amplifying unit 12 asillustrated in FIG. 6, first, description is made of an operation of themeasuring system (configuration) illustrated in FIG. 8.

The measuring system is used for a case where, as illustrated in FIG. 8,the signal amplifying unit 12 illustrated in FIG. 6 is omitted and theprocessing is performed on only the output signals of the X-axisacceleration sensor 11-1 and the X-axis magnetic sensor 11-4.

Now, it is supposed that, in FIG. 8, the output signal of the X-axisacceleration sensor 11-1 is Sg and the output signal of and the X-axismagnetic sensor 11-4 is Sm.

It is supposed that the switches 13-1 and 13-4 perform switchingoperations in response to control signals given from the control unit(not illustrated). Further, the switches 13-1 and 13-4 have first andsecond operating states, as illustrated in FIG. 9, and respectiveoperations are performed during first and second periods T1 and T2. InFIG. 9, “+1” designates that the switch provides a non-inverted outputand “−1” designates that the switch provides an inverted output.

During the first period T1, first, the switches 13-1 and 13-4 of thesignal inverting unit 13 have operating states as illustrated in FIG. 9.Therefore, an output signal of the switch 13-1 becomes a signal Sg withthe output signal Sg of the sensor 11-1 being non-inverted, and anoutput signal of the switch 13-4 becomes a signal Sm with the outputsignal Sm of the sensor 11-4 being non-inverted. Accordingly, the outputsignals of the switches 13-1 and 13-4 correspond to those of the outputsignals Sg and Sm of the sensors 11-1 and 11-4 multiplied by factors of+1 and +1.

During the succeeding second period T2, the switches 13-1 and 13-4 ofthe signal inverting unit 13 take the operating states illustrated inFIG. 9. Therefore, the output signal of the switch 13-1 becomes thesignal Sg with the output signal Sg of the sensor 11-1 beingnon-inverted, and the output signal of the switch 13-4 becomes a signal−Sm with the output signal Sm of the sensor 11-4 being inverted.Accordingly, the output signals of the switches 13-1 and 13-4 result inthe output signals Sg and Sm of the sensors 11-1 and 11-4 multiplied byfactors of +1 and −1, respectively.

Accordingly, it is supposed that during the first period T1, the signalinverting unit 13 outputs the output signals which are subjected tocombining operation by the combination unit 14 such that the measuringunit 15 outputs the output signal, which is assumed to be P1. Similarly,it is supposed that, during the second period T2, the measuring unit 15outputs the output signal, which is assumed to be P2. Then, the outputsignals P1 and P2 of the measuring unit 15 are given as follows.

P1=Sg+Sm  (22)

P2=Sg−Sm  (23)

From these two equations, the output signals Sg′ and Sm′ of the sensors11-1 and 11-4 can be inversely obtained by the computing unit 16 and,more particularly, can be expressed as follows.

Sg′=(P1+P2)/2  (24)

Sm′=(P1−P2)/2  (25)

Next, the operation of embodiment 2 will be described with reference toFIG. 10 in consideration of the foregoing description.

FIG. 10 is a block diagram for processing only the output signals of theX-axis acceleration sensor 11-1 and the X-axis magnetic sensor 11-4 inFIG. 6 and differs from FIG. 8 in that the signal amplifying unit 12 isfurther provided.

The signal amplifying unit 12 of FIG. 10 includes a signal amplifyingcircuit 12-1. The signal amplifying circuit 12-1 includes, for example,an attenuator or the like as illustrated in FIG. 11. It is supposed thata signal level of the signal amplifying circuit 12-1 has anamplification rate of 1/α (provided α>=1).

As to the signal amplifying unit 12 illustrated in FIG. 10, the outputsignal of the X-axis acceleration sensor 11-1 is amplified by the signalamplifying circuit 12-1 and input to the switch 13-1. In addition, theoutput signal of the X-axis magnetic sensor 11-4 is input without changeto the switch 13-4.

In case of embodiment 2 of FIG. 10, therefore, referring to theequations (22) and (23), the output signals P1 and P2 of the measuringunit 15 are expressed as follows.

P1=(Sg/α)+Sm  (22A)

P2=(Sg/α)−Sm  (23A)

From these two equations, the computing unit 16 is capable of obtainingthe output signals Sg′ and Sm′ of the sensors 11-1 and 11-4, which areexpressed as follows upon referring to the equations (24) and (25).

Sg′=(α/2)×(P1+P2)/2  (24A)

Sm′=(½)×(P1−P2)/2  (25A)

Moreover, the foregoing description has been made for processing onlythe output signals of the X-axis acceleration sensor 11-1 and the X-axismagnetic sensor 11-4. However, the same description will be exactly madeeven for the Y-axis acceleration sensor 11-2 and the Y-axis accelerationsensor 11-5, and the Z-axis magnetic sensor 11-3 and the Z-axisacceleration sensor 11-6. In addition, as described above, the type ofthe sensors may not be two types and may be any types while the numberof the sensors may not be two and may include any number.

(Studies on SN Ratio)

Next, an SN ratio of embodiment 2 illustrated in FIG. 10 will be studiedwith reference to Comparative Examples 1 to 3.

SN Ratios of Comparative Examples

First, a measuring system for a sensor signal subjected to thetime-sharing process, as illustrated in FIG. 14, is assumed to beComparative Example 1 and an SN ratio of such Comparative Example 1 willbe studied.

As illustrated in FIG. 12, the measuring system, related to ComparativeExample 1, includes sensors 11-1 and 11-4, switches 18-1 and 18-2, andthe measuring unit 15. With the switches 18-1 and 18-3 being turned on,the output signals Sg and Sm of the sensors 11-1 and 11-4 are input tothe measuring unit 15 in time sharing such that these signals are outputfrom the measuring unit 15 as the output signals Sg′ and Sm′.

Here, it is supposed that the sensor 11-1 illustrated in FIG. 12 hassensor noise of ±Ng and the sensor 11-4 has sensor noise of ±Nm.Moreover, none of the switches 18-1 and 18-4 generates noise but it iscommon practice for the measuring unit 15 to generate noise mainly on asignal amplifier (such as an operating amplifier), and hence, this noiseis assumed to be ±Na.

The output signals Sg′, Sm′ of the measuring unit 15, when includingsuch noises, are given as follows.

Sg′=Sg±Ng±Na  (26)

Sm′=Sm±Nm±Na  (27)

According to Comparative Example 1 illustrated in FIG. 12, due to thetime-sharing process, a final output of the X-axis acceleration sensor11-1 has an SN ratio determined only by the respective values of theacceleration sensors and noise Na of the measuring unit 15 in common tothe X-axis magnetic sensor 11-4. Likewise, an SN ratio of a final outputof the X-axis magnetic sensor 11-4 is determined only by the respectivevalues of the magnetic sensors and noise Na of the measuring unit 15.According to Comparative Example 1 illustrated in FIG. 12, thus, acircumstance under which the SN ratios of the respective sensors arelarge or small is reflected directly over a result in which the SN ratioof the final output is large or small.

Next, an SN ratio of Comparative Example 2 will be studied with themeasuring system illustrated in FIG. 8 taken as Comparative Example 2.

It is supposed that in FIG. 8, sensor noise of the sensor 11-1 is ±Ngand sensor noise of the sensor 11-4 is ±Nm. Although none of theswitches 13-1, 13-4 or the combination unit 14 generates noise,moreover, it is supposed that noise of the measuring unit 15 is ±Na.

Therefore, the output signals P1, P2 of the measuring unit 15 includingnoise are expressed as follows by referring to the equations (22) and(23).

P1=Sg+Sm±Ng±Nm±Na  (28)

P2=Sg−Sm±Ng±Nm±Na  (29)

Here, assuming that all of respective noises are white noises (i.e., anoise vector having no dependence on frequency) which are independentfrom each other, the equations (28) and (29) are written as follows.

P1=Sg+Sm±√{square root over ( )}(Ng ² +Nm ²)±Na

P2=Sg−Sm±√{square root over ( )}(Ng ² +Nm ²)±Na  (Expression 8)

Substituting both the equations of “Expression 8” in the equations (24)and (25), the output signals Sg′, Sm′ of the computing unit 16 of themeasuring system of FIG. 8 are given as follows based on the sameassumption as that mentioned above.

$\begin{matrix}{{{Sg}^{\prime} = {{{Sg} \pm {\sqrt{\;}( \frac{{Ng}^{2} + {Nm}^{2}}{2} )}} \pm \frac{Na}{\sqrt{\;}2}}}{{Sm}^{\prime} = {{{Sm} \pm {\sqrt{\;}( \frac{{Ng}^{2} + {Nm}^{2}}{2} )}} \pm \frac{Na}{\sqrt{\;}2}}}} & ( {{Expression}\mspace{14mu} 9} )\end{matrix}$

Comparative Example 2, from which “Expression 9” is obtained, will bestudied on an assumption given to sensitivities and noises of therespective sensors as follows.

Sensor Sensitivity (X-axis of Acceleration Sensor)>Sensor Sensitivity(X-axis of Magnetic Sensor)

Sensor Noise (X-axis of Acceleration Sensor)=Sensor Noise (X-axis ofMagnetic Sensor)

Under such an assumption, the SN ratios of both sensors have themagnitude relationships expressed as follows.

SN Ratio of Sensor (X-axis of Acceleration Sensor)>SN Ratio of Sensor(X-axis of Magnetic Sensor)

This assumption does not mean a specified case and frequently appearson, for example, the six-axis electronic compass described above. Todescribe in more detail, there are cases in which the accelerationsensor has a relatively large sensor output relative to 1 G (i.e.,gravity acceleration of 9.8 m/s/s in general), whereas the magneticsensor has a relatively small sensor output relative to 50 μT (with μT,micro Tesla, corresponding to the magnitude of earth's magnetic field atTokyo).

In actual applications, however, there are cases in which the six-axiselectronic compass is desired to be applied to a pedometer using athree-axis acceleration sensor and a magnetic compass using a three-axismagnetic sensor. In such cases, there are needs in which the SN ratio ofthe acceleration sensor is not so high, whereas the SN ratio of themagnetic sensor is desired to be as high as possible. To satisfy suchneeds, accordingly, it is necessary to have a technique to relativelyinverse the SN ratios of both the sensors in signal processing methodsof the sensors.

A study will be conducted firstly as to an SN ratio occurring when thesix-axis electronic compass is subjected to the time-sharing process inComparative Example 1 illustrated in FIG. 12.

In order to simplify the consideration, here, it is supposed that noisesof the acceleration sensor and the magnetic sensor which are placedequally are ±Ns and noise ±Na of the measuring unit 15 is ignored (i.e.,Na=zero). From the equations (26) and (27), the output signals Sg′, Sm′of the measuring unit 15 of FIG. 14 are given as follows.

Sg′=Sg±Ng=Sg±Ns  (30)

Sm′=Sm±Nm=Sm±Ns  (31)

Therefore, the SN ratios of both sensors are respectively given asfollows.

Sensor SN ratio(X-axis acceleration sensor)=Sg/Ns  (32)

Sensor SN ratio(X-axis magnetic sensor)=Sm/Ns  (33)

Accordingly, the SN ratios of both sensors have a magnitude relationshipthat remains under the above-noted assumption, as expressed as follows.

Sensor SN ratio (X-axis acceleration sensor)>Sensor SN ratio (X-axismagnetic sensor)

For this reason, in Comparative Example 1 of FIG. 12, a sensitivityratio Sg:Sm of both sensors 11-1 and 11-4 appears without change as aratio between the SN ratios of the sensor outputs subsequent to theexecution of signal processing.

Next, the SN ratios of the sensors 11-1 and 11-4 of Comparative Example2 of FIG. 8 mentioned above will be studied. Suppose that noise ±Na(i.e., Na=zero) of the measuring unit 15 is ignored in the same manneras that mentioned above, and the output signals Sg′ and Sm′ of themeasuring unit 15 of FIG. 8 can be simplified based on the above“Expression 9” as follows.

$\begin{matrix}{{{Sg}^{\prime} = {{{{Sg} \pm {\sqrt{\;}( \frac{{Ns}^{2} + {Ns}^{2}}{2} )}} \pm \frac{0}{\sqrt{\;}2}} = {{Sg} \pm {Ns}}}}{{Sm}^{\prime} = {{{{Sm} \pm {\sqrt{\;}( \frac{{Ns}^{2} + {Ns}^{2}}{2} )}} \pm \frac{0}{\sqrt{\;}2}} = {{Sm} \pm {Ns}}}}} & ( {{Expression}\mspace{14mu} 10} )\end{matrix}$

Both equations of “Expression 10” are similar to the case of theequations (30) and (31) representing the output signals Sg′ and Sm′ ofthe measuring unit 15 of FIG. 12.

Accordingly, the same results as those of the SN ratios of the sensorsof Comparative Example 1 illustrated in FIG. 14 can be derived, also asto the SN ratios of the sensors 11-1 and 11-4 of Comparative Example 2illustrated in FIG. 8 (see the equations (32) and (33)).

The studies heretofore can be summarized as follows.

According to Comparative Example 1 illustrated in FIG. 12 andComparative Example 2 illustrated in FIG. 8, in any of these cases, thetwo sensors 11-1 and 11-4 have sensitivities with a difference in themagnitude relationship. Such a difference in the magnitude relationshipis reflected directly over the SN ratio subsequent to the signalprocessing. Accordingly, the magnitude relationship between the SNratios cannot be inversed in Comparative Example 1 illustrated in FIG.12 and Comparative Example 2 illustrated in FIG. 8.

In order to address such an issue, it is conceivable for a dedicatedsignal processing circuit to be additionally provided for a sensor(i.e., a magnetic sensor in the six-axis electronic compass) for whichthere is a need to have an increased SN ratio subsequent to the signalprocessing. Alternatively, it is conceivable to extend a signalacquiring period. With such techniques, however, new issues will arisewith an increase in the circuit size and an increase in the electricpower consumption.

According to embodiment 2, therefore, the above issue is tried to beaddressed by the provision of the signal amplifying unit 12, asillustrated in FIG. 6 or FIG. 10.

In this manner, according to embodiment 2 of the present invention, thesignal amplifying unit 12 is provided as illustrated in FIG. 6 or FIG.10. Hereinafter, a description will be given of the technicalsignificance of the provision of the signal amplifying unit 12.

Firstly, the signal amplifying unit 12 illustrated in FIG. 10 isinterposed (i.e., added) between the sensors 11-1 and 11-4 and theswitches 18-1 and 18-2 in Comparative Example 1 illustrated in FIG. 12.This is regarded to be Comparative Example 3 and an SN ratio of thisComparative Example 3 is studied. In this situation, the noise of thesignal amplifying unit 12 is generally extremely small to be ignored.

In this case, when using the equations (26) and (27), the output signalsSg′ and Sm′ of the measuring unit 15 are given as follows.

$\begin{matrix}{{{Sg}^{\prime} = {\frac{{Sg} \pm {Ng}}{\alpha} \pm {Na}}}{{Sm}^{\prime} = {{{Sm} \pm {Nm}} \pm {Na}}}} & ( {{Expression}\mspace{14mu} 11} )\end{matrix}$

Suppose that the above Expression is assumed that noises of theacceleration sensor and the magnetic sensor are equal to ±Ns and thatthe noise ±Na of the measuring unit 15 is ignored (i.e., Na=zero), itturns out as follows.

Sg′=(Sg±Ns)/α  (34)

Sm′=Sm±Ns  (35)

The equations (34) and (35) have the SN ratios that are not differentfrom the SN ratios derived from the equations (30) and (31). Therefore,as in Comparative Example 3, even if the signal amplifying circuit 12illustrated in FIG. 10 is simply added to Comparative Example 1illustrated in FIG. 12, the SN ratios cannot be inversed.

SN Ratio of Embodiment 2

Next, the SN ratio occurring when subjected to the signal processingdescribed above in embodiment 2 illustrated in FIG. 10 will be studied.Here, the noise of the signal amplifying unit 12 is extremely small ingeneral to be ignored.

In this case, the output signals P1 and P2 of the measuring unit 15including noises are expressed as follows by referring to the equations(28) and (29) and two equations of the “Expression 8”.

$\begin{matrix}{\begin{matrix}{{P\; 1} = {\frac{Sg}{\alpha} + {{{{Sm} \pm ( \frac{Ng}{\alpha} )} \pm {Nm}} \pm {Na}}}} \\{= {\frac{Sg}{\alpha} + {{{Sm} \pm {\sqrt{\;}\lbrack {( \frac{Ng}{\alpha} )^{2} + {Nm}^{2}} \rbrack}} \pm {Na}}}}\end{matrix}\begin{matrix}{{P\; 2} = {\frac{Sg}{\alpha} - {{{{Sm} \pm ( \frac{Ng}{\alpha} )} \pm {Nm}} \pm {Na}}}} \\{= {\frac{Sg}{\alpha} - {{{Sm} \pm {\sqrt{\;}\lbrack {( \frac{Ng}{\alpha} )^{2} + {Nm}^{2}} \rbrack}} \pm {Na}}}}\end{matrix}} & ( {{Expression}\mspace{14mu} 12} )\end{matrix}$

By substituting both of the equations of “Expression 12” in theequations (24) and (25), the output signals Sg′ and Sm′ of the computingunit 16 of the measuring system of FIG. 10 are given as follows.

$\begin{matrix}{{{Sg}^{\prime} = {{\frac{Sg}{\alpha} \pm {\sqrt{\;}\lbrack \frac{( {{Ng}/\alpha} )^{2} + {Nm}^{2}}{2} \rbrack}} \pm \frac{Na}{\sqrt{\;}2}}}{{Sm}^{\prime} = {{{Sm} \pm {\sqrt{\;}\lbrack \frac{( {{Ng}/\alpha} )^{2} + {Nm}^{2}}{2} \rbrack}} \pm \frac{Na}{\sqrt{\;}2}}}} & ( {{Expression}\mspace{14mu} 13} )\end{matrix}$

Both of the equations indicated in this “Expression 13” are complex, andhence, are simplified in the same manner as that previously performed.That is, suppose that the acceleration sensor and the magnetic sensorhave noises equal to each other to be ±Ns and the noise ±Na of themeasuring unit 15 is ignored (i.e., Na=zero), this gives the followingexpressions.

$\begin{matrix}{{{Sg}^{\prime} = {{{\frac{Sg}{\alpha} \pm {\sqrt{\;}\lbrack \frac{( {{Ns}/\alpha} )^{2} + {Ns}^{2}}{2} \rbrack}} \pm \frac{0}{\sqrt{\;}2}} = {\frac{Sg}{\alpha} \pm {{Ns} \cdot \sqrt{\frac{( {1/\alpha} )^{2} + 1}{2}}}}}}{{Sm}^{\prime} = {{{{Sm} \pm {\sqrt{\;}\lbrack \frac{( {{Ns}/\alpha} )^{2} + {Ns}^{2}}{2} \rbrack}} \pm \frac{0}{\sqrt{\;}2}} = {{Sm} \pm {{Ns} \cdot \sqrt{\frac{( {1/\alpha} )^{2} + 1}{2}}}}}}} & ( {{Expression}\mspace{14mu} 14} )\end{matrix}$

Accordingly, all of the SN ratios of Comparative Examples 1 to 3 areinvariant prior to or subsequent to the signal processing, whereas inembodiment 2, noises vary as expressed below, respectively.

That is, the X-axis acceleration sensor 11-1 has noise that varies asexpressed below.

$\begin{matrix} ( {{Comparative}\mspace{14mu} {Example}} )arrow {( {{Present}\mspace{14mu} {Method}} ) \pm \frac{Ns}{\alpha}}arrow{{\pm {Ns}} \cdot \sqrt{\frac{( {1/\alpha} )^{2} + 1}{2}}}   & ( {{Expression}\mspace{14mu} 15} )\end{matrix}$

Further, the X-axis magnetic sensor 11-4 has noise that varies asexpressed below.

$\begin{matrix} ( {{Comparative}\mspace{14mu} {Example}} )arrow {( {{Present}\mspace{14mu} {Method}} ) \pm {Ns}}arrow{{\pm {Ns}} \cdot \sqrt{\frac{( {1/\alpha} )^{2} + 1}{2}}}   & ( {{Expression}\mspace{14mu} 16} )\end{matrix}$

On the other hand, according to embodiment 2, when comparing theequations (34) and (35) to both of the equations of the “Expression 14”,the respective signal components of both of the sensors are invariant.Consequently, allowing the SN ratio in Comparative Example 1 to bestandardized as 1, the SN ratios of the respective sensors of embodiment2 vary after the signal processing in accordance with embodiment 2 asexpressed below.

That is, the SN ratio of the X-axis acceleration sensor 11-1 has avariation (i.e., supposed to be SNg) to be described below.

$\begin{matrix}{{SNg} = {\sqrt{\frac{2}{\alpha^{2} + 1}} - {times}}} & ( {{Expression}\mspace{14mu} 17} )\end{matrix}$

Further, the SN ratio of the X-axis magnetic sensor 11-4 has a variation(i.e., supposed to be 5 mg) to be expressed below.

$\begin{matrix}{{SNm} = {\sqrt{\frac{2\; \alpha^{2}}{\alpha^{2} + 1}} - {times}}} & ( {{Expression}\mspace{14mu} 18} )\end{matrix}$

The relationship α>=1 is satisfied as previously assumed, and therespective change values indicated in “Expression 17” and “Expression18” have the following magnitude relationships.

SNg<=1  (36)

SNm>=1  (37)

In embodiment 2, accordingly, the SN ratio of the X-axis accelerationsensor 11-1 is deteriorated as compared to Comparative Examples 1 to 3,but the SN ratio of the X-axis magnetic sensor 11-4 is improved.

According to embodiment 2, as described above, the signal amplifyingunit 12 is provided as illustrated in FIG. 6 or FIG. 10, and the signalprocessing is performed as described above. This makes it possible tocreate a magnitude relationship of the SN ratio opposite to themagnitude relationship of the SN ratio of the sensor.

More particularly, in view of SNg/SNm=1/α from both of the equationsillustrated in “Expression 17” and “Expression 18”, when the SN ratiosof the sensors have a difference of a times and the signal amplifyingunit 12-1 is made to have an amplification rate of 1/α times, both ofthe SN ratios are equalized after the signal processing.

In addition, in embodiment 2, it becomes possible to arbitrarily set theamplification rate of the signal amplifying unit 12-1. Hence, if, forexample, 1/β times (provided α<β) is set, the magnitude relationship ofthe SN ratios of the sensors per se can be inverted after the signalprocessing.

More particularly, further, applying embodiment 2 to the six-axiselectronic compass gives the following description.

It is supposed that the SN ratio (i.e., a result from the sensor outputrelative to 1 G divided by the noise of the acceleration sensor) is γ(γ>=1) times the SN ratio (i.e., a result from the sensor outputrelative to 50 uT divided by the noise of the magnetic sensor) of themagnetic sensor.

Meanwhile, when embodiment 2 is applied to the pedometer using thethree-axis acceleration sensor and the magnetic compass using thethree-axis magnetic sensor respectively, the SN ratio of the magneticcompass inversely needs to be η times (η>=1) of the SN ratio of thepedometer. Under such a case, the amplification rate of the signalamplifying unit 12-1, processed for the acceleration sensor, is set to1/β times=1/(γη) times. Subsequently, the technique of the signalprocessing from the signal inverting unit 13 to the computing unit 16 isusable.

In the example of FIG. 10, further, although the signal amplifying unit12 has been described with reference to one example that includes thesignal amplifying circuit 12-1, it can be configured with anotherelement.

Furthermore, in the example of FIG. 10, although the signal amplifyingunit 12 has been described with reference to the case where theamplification rate is set to 1/α times (where α>=1) for the sensor thatmay have a reduced SN ratio after the signal processing. However, whenthe sensor, intended for the SN ratio to be inversely increased afterthe signal processing, is amplified by a times (where α>=1), a signalamplifying circuit is adopted as a component element of the signalamplifying unit 12, so that the completely same effect being obtained intheory.

Moreover, the signal amplifying circuit is not provided for only one ofthe sensors, but the signal amplifying circuits may be preferablyprovided for both of the sensors.

Considering a case where embodiment 2 is embodied, except for a casewhere the sensor signal is extremely small, the use of a signalamplifying circuit (i.e., attenuation circuit) with an amplificationrate less than 1.0 can be considered more preferable, instead of the useof a signal amplifying circuit with an amplification rate greater than1.0. This is because the attenuation circuit has advantages, such as asmaller circuit size, less power consumption needed for the amplifyingoperation, and less noise than those of the signal amplifying circuit.

Although the foregoing description has been made for the case where thetwo sensors have equal noises (i.e., ±Ng=±Nm=±Ns), the present inventionis applicable to sensors having not only same noise but also the samesensitivity, or to sensors of the same type in a further limited manner.

For example, the sensors A-1 and the sensor A-2 belong to the same type,and have sensitivities, noises and SN ratios all of which are equal.However, when the sensor A-1 is desired to have a higher SN ratio afterthe signal processing, the signal amplifying unit 12 may amplify theoutput signal of the sensor A-1 at an amplification rate greater than1.0 time or amplify the output signal of the sensor A-2 at theamplification rate less than 1.0 time.

Further, the present invention is also applicable to a case where thetwo sensors have different noises, so that the substantially sameconclusions as those previously noted above can be derived. Suchconclusions are concretely represented by numeric values, which areillustrated in FIG. 13.

FIG. 13 illustrates a case where noises ±Ng and ±Nm of the sensors 1-1and 1-4 are different such as ±Ng≠±Nm.

In practice, an arbitrary positive number is initially defined and anoperation is performed to satisfy |±Ng|/α2=|±Nm|. This operation is nota special one, and it is only necessary for the signal amplifying unit12 described hereinabove to amplify or attenuate the output of theX-axis acceleration sensor. By performing such an operation, asubsequent signal processing method is performed in the exactly samemanner. Hence, the subsequent calculations can be led in the exactlysame manner.

Accordingly, α1, which is newly defined here, represents a parameterthat serves the exactly same function as that of previous α andsimilarly has the magnitude expressed as α1>=1.

A final calculation result of the SN ratio of the sensor is indicated asillustrated in FIG. 13 and is supplemented as follows.

With the equation for the SN ratio of the magnetic sensor, previous ahas been merely changed to α1 without changing any other parameters.

Additionally, α2 is not relied on. Accordingly, the assumption withα1>=1 surely increases the SN ratio.

Further, the SN ratio of the acceleration sensor tends to increase ordecrease depending on the magnitude of α2, that is, the magnitude oforiginal sensor noise. However, under a condition in which the originalSN ratio of the acceleration sensor is greater than the original SNratio of the magnetic sensor, a precondition is set based on themagnitude relationship of satisfying α2<α1. Accordingly, it is unlikelythat the SN ratio is infinitely minimized.

Modification to Embodiment 2

Next, a modification to embodiment 2 will be described with reference toFIG. 14.

According to the signal processing device of embodiment 2 illustrated inFIG. 10, the two types of (i.e., two) the acceleration sensor 11-1 andthe magnetic sensor 11-4 have been described. This modification includesfour types of sensors 11-7 to 11-10 which are replaced as illustrated inFIG. 14.

It is supposed that the four types of sensors 11-7 to 11-10 have thefollowing relationships.

Sensor 11-7 . . . Original sensitivity is high with a high SN ratio.

Sensor 11-8 . . . Both of sensitivity and SN ratio are second highest.

Sensor 11-9 . . . Both of sensitivity and SN ratio are third highest.

Sensor 11-10 . . . Original sensitivity is lower than those of the abovethree types, and an amplifying circuit has to be provided in thevicinity of the sensor.

This modification causes the SN ratios of the sensors 11-7 to 11-10 tobe nearly equalized after the signal processing and the signalamplifying unit 12 has a concrete configuration as illustrated in FIG.14.

That is, in order to the most remarkably attenuating the output of thesensor 11-7, a signal amplifying circuit 12-2 having the greatestattenuation rate is interposed between the sensor 11-7 and the switch13-7.

In order to attenuate the output of the sensor 11-8, a signal amplifyingcircuit 12-3 having a smaller attenuation rate than that of the signalamplifying circuit 12-2 is interposed between the sensor 11-8 and theswitch 13-8. Next, when the signal amplifying circuit 12-2 has theattenuation rate of 1/α2 and the signal amplifying circuit 12-3 has theattenuation rate of 1/α3, the attenuation rate is set to satisfy1>1/α3>1/α2.

To attenuate the output of the sensor 11-10, a signal amplifying circuit12-4 is interposed between the sensor 11-10 and the switch 13-10. Thesignal amplifying circuit 12-4 has an attenuation rate α4 that is set tobe greater than 1.

An output of the sensor 11-9 is directly to the switch 13-9 withoutbeing subjected to attenuation or amplification.

Further, this modification has the same configuration as that ofembodiment 2 illustrated in FIG. 6 except for the component partsillustrated in FIG. 14. Hence, its description is here omitted.

As will be apparent from this modification, the amplifying andattenuating functions of the signal amplifying unit 12 consistentlyexist for changing the relative SN ratios between the sensors.Consequently, it is wasteful to have a configuration such that all ofthe targeted sensors are attenuated or all of the targeted sensors areamplified. Therefore, it is a reasonable configuration to allow at leastone sensor to transfer the sensor signal without change (i.e., with noamplification and attenuation) to a switch in its subsequent stage. InFIG. 14, the sensor 11-9 is selected for such a sensor signal.

Next, embodiment 3 according to the present invention will be described.

Configuration of Embodiment 3

FIG. 15 is a block diagram illustrative of a configuration example of asignal processing device of embodiment 3 according to the presentinvention.

The signal processing device according to embodiment 3 includes nsensors 21-1 to 21-n, a signal inverting unit 22 having n amplifyingswitches 22-1 to 22-n, a combination unit 23, a measuring unit 24, and acomputing unit 25. The signal inverting unit 22 has signal invertingfunctions as well as amplifying functions.

The n sensors 21-1 to 21-n convert physical quantities into electricsignals, which are output as output signals, respectively. These sensors21-1 to 21-n are not limited by their types and different sensors can beused. In the following description, it is supposed that the sensors 21-1to 21-n include configurations, in which a sensitive part has bothterminals provided with electrode terminals, respectively, that is,two-terminal type sensors.

The n amplifying switches 22-1 to 22-n are provided in conform to the nsensors 21-1 to 21-n. That is, the amplifying switches 22-1 to 22-n areconnected to the associated sensors 21-1 to 21-n, respectively, and havethe same functions. A concrete example of the signal inverting unit 22will be described below.

The amplifying switches 22-1 to 22-n output respective output signals ofthe sensors 21-1 to 21-n. The combination unit 23 generates combinedsignals C1 to Cn with these output signals connected (or combined) inseries or generates the combined signals C1 to Cn with these outputsignals connected (or combined) in parallel.

Here, when attempting for the sensor 21-1 to 21-n to include thetwo-terminal sensors, there are, for example, a voltage output type anda current output type. Therefore, when the sensors 21-1 to 21-n are thevoltage output types, respective output signals are combined in seriesto generate the combined signals. In case of the current output types,the respective output signals are combined in parallel to generate thecombined signals.

Further, when the sensors 21-1 to 21-n are other output types such as,for example, capacity types or resistance types, it is only necessary toprovide an electric circuit for converting these into voltages orcurrents.

The measuring unit 24 sequentially receives the combined signals C1 toCn generated by the combination unit 23 in synchronization with theoperation of the signal inverting section 22. The respective combinedsignals C1 to Cn are subjected to a predetermined process, such asamplification or AD conversion.

The measuring unit 24 receives the combined signals C1 to Cn andperforms a predetermined process, and then the computing unit 25linearly combines the received signals by performing a predeterminedcomputation. Based on such linear combination, the predeterminedcomputation is performed to acquire respective output signals of thesensors 21-1 to 21-n and the computation results are output.

The computing process of the computing unit 25 for acquiring respectiveoutput values of the sensors 21-1 to 21-n may be realized by a CPU(Central Processing Unit) or software of a microcomputer.

Next, a concrete configuration of the sensors 21-1 to 21-n to thecombination unit 23 of FIG. 15 will be described with reference to FIG.16.

FIG. 16 represents a configuration example of a case where thetwo-terminal voltage output type sensors are adopted as the sensors 21-1to 21-n in embodiment 3 of FIG. 15.

As illustrated in FIG. 16, the signal processing device of embodiment 3includes the n sensors 21-1 to 21-n, a signal inverting unit 22A, themeasuring unit 24 and the computing unit 25.

According to embodiment 3, configurations corresponding to the signalinverting unit 22 and the combination unit 23 of embodiment 3,illustrated in FIG. 15, are embodied with the signal inverting unit 22Aof FIG. 516.

As illustrated in FIG. 16, the signal inverting unit 22A includes theamplifying switches 22-1 to 22-n.

The amplifying switch 22-1 includes a switch group 22-1 a and a commonamplifier 22-A. The amplifying switch 22-2 includes a switch group 22-2a and the common amplifier 22-A. Likewise, the n-th switch group 22-nincludes a switch group 22-na and the common amplifier 22-A.

The switch group 22-1 a includes switches 22-1A to 22-1F and the switchgroup 22-2 a includes switches 22-2A to 22-2F. Likewise, the switchgroup 22-na includes switches 22-nA to 22-nF.

The amplifier 22-A has an amplification rate of −α times. Among theoutput signals V1 to Vn of the n sensors 21-1 to 21-n, the outputs,selected by the switch group 22-1 a, 22-2 a . . . 22-na, are invertedand amplified by the amplifier 22-A for generating inverted andamplified signals.

In the example of FIG. 16, here, although the n amplifying switches 22-1to 22-n employ (i.e., share) the same amplifier 22-A, individualamplifiers may be provided.

The measuring unit 24 sequentially receives the n combining voltages(i.e., combined signals) P1 to Pn, generated by the signal invertingunit 22A in synchronization with the operation of the signal invertingunit 22A, and performs amplifications as well as AD conversions. To thisend, although not illustrated, the measuring unit 24 is provided with anamplifying unit and an AD converting unit.

The computing unit 25 linearly combines the voltages P1 to Pn of outputdata output from the measuring unit 24 by a predetermined computation,and performs another predetermined computation, based on thepredetermined computation, to obtain respective output values of thesensors 21-1 to 21-n and output computation results.

Operation of Embodiment 3

Next, an operation example of embodiment 3 will be described withreference to the accompanying drawings.

It is supposed that in FIG. 16, switching operations of the switch group22-1 a, 22-2 a . . . 22-na of the amplifying switches 22-1 to 22-n areperformed in response to control signals from a control unit (notillustrated).

The switch group 22-1 a, 22-2 a . . . 22-na of amplifying switches 22-1to 22-n have first to n-th operating states in one cycle as illustratedin FIG. 17 and respective operations are performed during first to n-thperiods T1 to Tn.

Firstly, in the first period T1, as to the switch group 22-1 a, only theswitches 22-1A, 22-1C, 22-1D, and 22-1F turn on. Moreover, as to theswitch group 22-2 a, only the switches 22-2B and 22-2E turn on. Inaddition, as to the switch group 22-na, only the switches 22-nB and22-nE turn on. This allows the switches to fall in turn-on states asillustrated in FIG. 16.

Therefore, in the first period T1, only the output V1 of the sensor 21-1is inverted and amplified by −α times by the amplifier 22-A to providean inverted and amplified signal. The outputs V2 to Vn of the othersensors 21-2 to 21-n are not inverted or amplified to provide anon-inverted signal. Then, these signals are combined and the signalinverting unit 22A provides an output (−αV1+V2+ . . . +Vn).

Subsequently, in the period T2, in the switch group 22-1 a, only theswitches 22-1B, 22-1E turn on. Moreover, in the switch group 22-2 a,only the switches 22-2A, 22-2C, 22-2D, and 22-2F turn on. Then, in theswitch group 22-na, only the switches 22-Nb and 22-nE turn on.

Therefore, in the second period T2, the amplifier 22-A inverts andamplifies only the output V2 of the sensor 21-2 by −α times to providean inverted and amplified signal. None of the respective outputs V1, V3to Vn of the sensors other than that of the sensor 21-2 is inverted noramplified to provide a non-inverted signal. Then, these signals arecombined and the signal inverting unit 22A provides an output (V1−αV2+ .. . +Vn).

Likewise, in the n-th period Tn, in the switch group 22-1 a, only theswitches 22-1B and 22-1E turn on. Moreover, in the switch group 22-2 a,only the switches 22-2B and 22-2E turn on. In the switch group 22-na,only the switches 22-nA, 22-nC, 22-nD, and 22-nF turn on.

Therefore, in the n-th period Tn, the amplifier 22-A inverts andamplifies only the output Vn of the sensor 1-n by −α times to provide aninverted and amplified signal. The outputs of the sensors, other thanthe sensor 1-n, is not inverted or amplified to provide a non-invertedsignal. Then, these signals are combined and the signal inverting unit22A provides an output (V1+V2+ . . . −αVn).

The switching operations of the amplifying switches 22-1 to 22-n in thefirst to n-th periods T1 to Tn are summarized as illustrated in FIG. 17.

Referring to FIG. 17, a voltage obtained by the amplifying switch 22-1includes a voltage −αV1 that is −α times the output voltage V1 of thesensor 21-1 in the period T1, and in the other periods T2 to Tn, anon-inverted voltage V1 which is +1 times the output voltage V1 isobtainable.

Further, a voltage obtained by the amplifying switch 22-2 includes avoltage −αV2 that is −α times the output voltage V2 of the sensor 21-2in the period T2, and in the other periods T1 and T3 to Tn, anon-inverted voltage V2 that is +1 times the output voltage V2 isobtainable.

Likewise, a voltage obtained by the amplifying switch 22-n includes avoltage −αV2 that is −α times the output voltage Vn of the sensor 21-nin the period Tn, and in the other periods, a non-inverted voltage Vnthat is +1 times the output voltage Vn is obtainable.

In FIG. 17, when the respective voltages obtained by the amplifyingswitches 22-1 to 22-n include non-inverted voltages, “+1” is indicated,whereas when the voltage is a voltage of −α times, “−α” is indicated.

Accordingly, the respective output voltages P1 to Pn output from thesignal inverting unit 22A in the period T1 to Tn as described above aregiven as follows.

$\begin{matrix}\begin{matrix}\begin{matrix}{{P\; 1} = {{{- \alpha}\; V\; 1} + {V\; 2} + {V\; 3} + \ldots + {{Vn}\mspace{295mu} ( {38\text{-}1} )}}} \\{{P\; 2} = \; {{V\; 1} - {\alpha \; V\; 2} + {V\; 3} + \ldots + {{Vn}\mspace{310mu} ( {38\text{-}2} )}}}\end{matrix} \\{{P\; 3} = {{V\; 1} + {V\; 2} - {\alpha \; V\; 3} + \ldots + {{Vn}\mspace{315mu} ( {38\text{-}3} )}}}\end{matrix} \\\ldots \\{{P\; n} = {{V\; 1} + {V\; 2} + {V\; 3} + \ldots - {\alpha \; {Vn}\mspace{315mu} ( {38\text{-}n} )}}}\end{matrix}$

From these n equations, it becomes possible for the computing unit 25 toinversely acquire the output voltages V1 to Vn of the sensors 21-1 to21-n. In particular, these are given as follows.

$\begin{matrix}\begin{matrix}\begin{matrix}\begin{matrix}{{V\; 1} = {{{1/\beta} \cdot \lbrack {{( {\alpha - n + 2} )P\; 1} + {P\; 2} + {P\; 3} + \ldots + {Pn}} \rbrack}\mspace{166mu} ( {39\text{-}1} )}} \\{{V\; 2} = {{{1/\beta} \cdot \lbrack {{P\; 1} + {( {\alpha - n + 2} )P\; 2} + {P\; 3} + \ldots + {Pn}} \rbrack}\mspace{160mu} ( {39\text{-}2} )}}\end{matrix} \\{{V\; 3} = {{{1/\beta} \cdot \lbrack {{P\; 1} + {P\; 2} + {( {\alpha - n + 2} )P\; 3} + \ldots + {Pn}} \rbrack}\mspace{166mu} ( {39\text{-}3} )}}\end{matrix} \\\ldots\end{matrix} \\{{V\; n} = {{{1/\beta} \cdot \lbrack {{P\; 1} + {P\; 2} + {P\; 3} + \ldots + {( {\alpha - n + 2} ){Pn}}} \rbrack}\mspace{160mu} ( {39\text{-}n} )}}\end{matrix}$

where β=−α²+(n−2) α+n−1.

In embodiment 3, accordingly, it becomes possible to calculate all ofthe respective output signals of the n sensors 21-1 to 21-n.

For example, when n is equal to 6, the output voltages P1 to P6 of thesignal inverting unit 2A are given as follows.

P1=−αV1+V2+V3+V4+V5+V6  (40-1)

P2=V1−αV2+V3+V4+V5+V6  (40-2)

P3=V1+V2−αV3+V4+V5+V6  (40-3)

P4=V1+V2+V3−αV4+V5+V6  (40-4)

P5=V1+V2−αV3+V4−αV5+V6  (40-5)

P6=V1+V2+V3+V4+V5−αV6  (40-6)

From these equations, the output voltages V1 to V6 of the sensors 21-1to 21-6 are given as follows.

V1=1/β·[(α−4)P1+P2+P3+P4+P5+P6]  (41-1)

V2=1/β·[P1+(α−4)P2+P3+P4+P5+P6]  (41-2)

V3=1/β·[P1+P2+(α−4)P3+P4+P5+P6]  (41-3)

V4=1/β·[P1+P2+P3+(α−4)P4+P5+P6]  (41-4)

V5=1/β·[P1+P2+P3+P4+(α−4)P5+P6]  (41-5)

V6=1/β·[P1+P2+P3+P4+P5+(α−4)P6]  (41-6)

where α=−α²+4α+5.

Next, a study will be conducted as to what extent the SN ratio isimproved in embodiment 3 as compared to the general time-sharingprocess.

FIG. 18 represents a case where noises (i.e., disruptive sounds) aresuperimposed in the measuring system of FIG. 16 and at operation timingsof FIG. 17. However, the illustrated embodiment 3 is based on FIG. 15.

It is supposed that such superimposed noises take noises at fixed valueswith respect to white noises, that is, for all frequency bands, and suchnoise values are designated as ±N. In addition, it is supposed that allof sensor noises of the n sensors 21-1 to 21-n have the same magnitudes±Ns but are uncorrelated to each other.

Further, it is supposed that no noise is newly generated by the signalinverting unit 22 or the combination unit 23 but noises depending onsensor noises and amplification rates are output without change. On theother hand, it is supposed that measuring noises are newly generated bythe amplifying unit or the AD converting unit of the measuring unit 24and such measuring noises are set to ±Na.

As a result, output voltages (including noises) are obtained, asillustrated in FIG. 18.

Accordingly, the output voltages P1 to Pn including noises are expressedas follows by reference to the above equations (38-1) to (38-n).

$\begin{matrix}{{P\; 1} = {{- {\alpha ( {{V\; 1} \pm {Ns}} )}} + ( {{V\; 2} \pm {Ns}} ) + ( {{V\; 3} \pm {Ns}} ) + \ldots + {( {{Vn} \pm {Ns}} ) \pm {{Na}\mspace{40mu} ( {42\text{-}1} )}}}} \\{{P\; 2} = {( {{V\; 1} \pm {Ns}} ) - {\alpha ( {{V\; 2} \pm {Ns}} )} + ( {{V\; 3} \pm {Ns}} ) + \ldots + {( {{Vn} \pm {Ns}} ) \pm {{Na}\mspace{59mu} ( {42\text{-}2} )}}}} \\{{P\; 3} = {( {{V\; 1} \pm {Ns}} ) + ( {{V\; 2} \pm {Ns}} ) - {\alpha ( {{V\; 3} \pm {Ns}} )} + \ldots + {( {{Vn} \pm {Ns}} ) \pm {{Na}\mspace{59mu} ( {42\text{-}3} )}}}} \\\ldots \\{{P\; n} = {( {{V\; 1} \pm {Ns}} ) + ( {{V\; 2} \pm {Ns}} ) + ( {{V\; 3} \pm {Ns}} ) + \ldots - {{\alpha ( {{Vn} \pm {Ns}} )} \pm {{Na}\mspace{59mu} ( {42\text{-}n} )}}}}\end{matrix}$

Here, the sensor noises of the sensors 21-1 to 21-n are uncorrelated toeach other, and hence, the above n equations are simplified as follows.

$\begin{matrix}{{P\; 1} = {{{- \alpha}\; V\; 1} + {V\; 2} + {V\; 3} + \ldots + {{{Vn} \pm {\sqrt{\;}( {\alpha^{2} + n - 1} ){Ns}}} \pm {{Na}\mspace{40mu} ( {43\text{-}1} )}}}} \\{{{P\; 2} = \; {{V\; 1} - {\alpha \; V\; 2} + {V\; 3} + \ldots + {{{Vn} \pm {\sqrt{\;}( {\alpha^{2} + n - 1} ){Ns}}} \pm {{Na}\mspace{56mu} ( {43\text{-}2} )}}}}\mspace{50mu}} \\{{{P\; 3} = \; {{V\; 1} + {V\; 2} - {\alpha \; V\; 3} + \ldots + {{{Vn} \pm {\sqrt{\;}( {\alpha^{2} + n - 1} ){Ns}}} \pm {{Na}\mspace{56mu} ( {43\text{-}3} )}}}}\mspace{56mu}} \\\ldots \\{{{P\; n} = \; {{V\; 1} + {V\; 2} + {V\; 3} + \ldots - {{{\alpha \; {Vn}} \pm {\sqrt{\;}( {\alpha^{2} + n - 1} ){Ns}}} \pm {{Na}\mspace{56mu} ( {43\text{-}n} )}}}}\mspace{56mu}}\end{matrix}$

These n equations are computed in the same ways as those of V1 to Vn inthe above equations (39-1) to (39-n). If the output V1 of the sensor21-1 is desired to calculate, only 1/β·[(α−n+2)P1+P2+P3+ . . . +Pn]should be calculated.

Further, the output voltages P1 to Pn are measured at different timeperiods, and therefore, sensor noises and measuring noise are basicallyuncorrelated to the measuring time periods with each other.

Accordingly, when considering the sensor noises and measuring noise,outputs V1′ to Vn′ of the respective sensors are given as follows.

$\begin{matrix}\begin{matrix}\begin{matrix}\begin{matrix}{{V\; 1^{\prime}} = {{V\; 1} \pm {{\gamma/{\beta ( {{\eta \; {Ns}} \pm {Na}} )}}\mspace{374mu} ( {44\text{-}1} )}}} \\{{V\; 2^{\prime}} = {{V\; 2} \pm {{\gamma/{\beta ( {{\eta \; {Ns}} \pm {Na}} )}}\mspace{374mu} ( {44\text{-}2} )}}}\end{matrix} \\{{V\; 3^{\prime}} = {{V\; 3} \pm {{\gamma/{\beta ( {{\eta \; {Ns}} \pm {Na}} )}}\mspace{374mu} ( {44\text{-}3} )}}}\end{matrix} \\\ldots\end{matrix} \\{{V\; n^{\prime}} = {{V\; n} \pm {{\gamma/{\beta ( {{\eta \; {Ns}} \pm {Na}} )}}\mspace{374mu} ( {44\text{-}n} )}}}\end{matrix}$

where β, γ, and η are given as follows.

β=−α²+(n−2)α+n−1  (45-1)

γ=√[α²+(−2n+4)α+n ²−3n+3]  (45-2)

η=√(α² +n−1)  (45-3)

Basically, the amplification rate α of the amplifier 22-A may bedetermined by using the above equations (44-1) to (45-3) for the nsensors. In the following, the SN ratios are studied with reference totwo concrete examples.

Concrete Example 1

Concrete example 1 demonstrates a case where the measuring noise isminimized when the number of sensors is 6.

That is, this is when n=6. Applying the foregoing calculations gives thefollowing.

V1′=V1±γ/β(ηNs±Na)  (46-1)

V2′=V2±γ/β(ηNs±Na)  (46-2)

V3′=V3±γ/β(ηNs±Na)  (46-3)

V4′=V4±γ/β(ηNs±Na)  (46-4)

V5′=V5±γ/β(ηNs±Na)  (46-5)

V6′=V6±γ/β(ηNs±Na)  (46-6)

β=−α²+4α+5  (47-1)

γ=√(α²−8α+21)  (47-2)

η=√(α²+5)  (47-3)

At this time, the case in which measuring noise representing thecondition of Concrete example 1 is minimized means a case in that f6 isminimized when f6=γ/βa is positive (f6>=0) and falls within a range ofα>=0.

As a result of differential calculations or numerical calculations orthe like, it is demonstrated that f6 takes a minimum value of 0.30 whenα≅1.21 is satisfied. At this time, β≅8.38, γ≅3.58, and η≅2.54 aresatisfied.

Accordingly, when the amplification rate α of the amplifier 22-A is setto 1.21, the following equations are obtainable.

V1′≅V1±1.09Ns±0.30Na  (48-1)

V2′≅V2±1.09Ns±0.30Na  (48-2)

V3′≅V3±1.09Ns±0.30Na  (48-3)

V4′≅V4±1.09Ns±0.30Na  (48-4)

V5′≅V5±1.09Ns±0.30Na  (48-5)

V6′≅V6±1.09Ns±0.30Na  (48-6)

Referring to these equations (48-1) to (48-6), it turns out that whensensor noises ±Ns are negligibly small, the SN ratio is improved by1/0.30 times, that is, approximately 3.3 times as compared to thegeneral time-sharing process.

Concrete Example 2

Concrete example 2 demonstrates a case where sensor noises are minimizedwith the n sensors.

Calculating α in the above equations (45-1) to (45-3) for minimizingfn=γη/β, it is demonstrated that α=n/2−1, and further, a minimum valuealways satisfies fn=1 regardless of n.

In this case, accordingly, β=n²/4, γ=n/2, and η=n/2 are satisfied andthe equations (49-1) to (49-n) are given as follows.

$\begin{matrix}\begin{matrix}\begin{matrix}{{V\; 1^{\prime}} = {{V\; 1} + {{Ns} \pm {( {2/n} ){Na}\mspace{394mu} ( {49\text{-}1} )}}}} \\{{V\; 2^{\prime}} = {{V\; 2} + {{Ns} \pm {( {2/n} ){Na}\mspace{394mu} ( {49\text{-}2} )}}}}\end{matrix} \\\ldots\end{matrix} \\{{V\; n^{\prime}} = {{V\; n} + {{Ns} \pm {( {2/n} ){Na}\mspace{394mu} ( {49\text{-}n} )}}}}\end{matrix}$

That is, when sensor noises are reasonably large, setting to satisfyα=n/2-1 allows the SN ratios due to sensor noise to be same as those ofthe time-sharing process. Further, the SN ratios due to measuring noisecan be improved by n/2 times.

In light of the foregoing studying results, regardless of the number ofthe sensors, when embodiment 3 (i.e., the measuring system) according tothe present invention is provided and the same calculations as thosediscussed above are performed, and the amplification rate α of theamplifier 22-A is calculated, it becomes possible to configure anoptimum signal processing device (with the highest SN ratio).

Meanwhile, the sensor noises and measuring noise can be arbitrarily set.Hence, if the sensor noises are relatively small, Concrete example 1 isrecommended, whereas if they are relatively large, Concrete example 2 isrecommended.

As a matter of course, however, even if the noises in combination ofsensor noises and measuring noise are minimized, it is needless to saythat the same procedures as those of the foregoing calculations can beset.

Next, embodiment 4 according to the present invention will be described.

Embodiment 4 is directed to a signal processing device suited for a casewhere resistance type sensors are used as the sensors.

Configuration of Embodiment 4

FIG. 19 is a block diagram illustrative of a configuration example ofthe signal processing device of embodiment 4 according to the presentinvention.

As illustrated in FIG. 19, embodiment 4 includes four resistance typesensors 31-1 to 31-4, a detection circuit forming unit 32, a measuringunit 33, and a computing unit 34.

The four resistance type sensors 31-1 to 31-4 are capable of detectingchanges in some physical quantities caused by changes in electricalresistance values, and such a definition follows a general institutionof the resistance type sensors.

To described in more detail using mathematical expressions, it issupposed that R is a resistance value of the resistance type sensorhaving a physical quantity serving as a reference and ΔR is a change inthe resistance value occurring when some physical quantities vary, and awhole resistance value r is given as r=R+ΔR.

Also, r and R represent the resistance values per se and surely takepositive values (i.e., greater than 0) but ΔR may be either positive,negative, or zero.

In embodiment 4, the four resistance type sensors 1-1 to 1-4 are presentand resistance values r1 to r4 of the resistance type sensors 31-1 to31-4 can be expressed as follows.

r1=R1+ΔR1  (50)

r2=R1+ΔR2  (51)

r3=R1+ΔR3  (52)

r4=R1+ΔR4  (53)

In this case, it is supposed that changes in the resistance values r1 tor4 of the four resistance type sensors 31-1 to 31-4 occur due to changesin the physical quantities that are different from each other.

Further, the four resistance type sensors 31-1 to 31-4 may includeoutput terminals as illustrated in FIG. 19.

The detection circuit forming unit 32 selects two predeterminedresistance type sensors from the four resistance type sensors 31-1 to31-4. As illustrated in FIG. 20A to FIG. 20D, predetermined resistancedetection circuits 321 to 324 including such selected two resistancetype sensors are sequentially formed or assembled.

For this reason, the detection circuit forming unit 32 includesreference resistors Rref (i.e., electric elements with no variations inthe electrical resistance values due to the physical quantities), apower supply terminal 325, and plural switches (not illustrated) forconnection between the selected resistance type sensors, connection tothe power supply terminal 325, and connection to the ground (see FIG.20A to FIG. 20D).

The detection circuit forming unit 32 sequentially performs respectiveoperations of phases 1 to 4 in a period of one cycle for measuring thephysical quantities, and forms the four resistance detection circuits321 to 324 depending on such phases 1 to 4 as illustrated in FIG. 20A toFIG. 20D.

In phase 1, as illustrated in FIG. 20A, the resistance detection circuit321 is formed of a half-bridge circuit in which resistances r1 and r3related to the resistance type sensors 31-1 and 31-3 and two resistancesRref for references are assembled.

In phase 2, as illustrated in FIG. 20B, the resistance detection circuit322 is formed of a half-bridge circuit in which resistors r2 and r3related to the resistance type sensors 31-2 and 31-3 and the tworesistances Rref for references are assembled.

In phase 3, as illustrated in FIG. 20C, the resistance detection circuit323 is formed of a half-bridge circuit in which resistors r2 and r4related to the resistance type sensors 31-2 and 31-4 and the tworesistances Rref for references are assembled.

In phase 4, as illustrated in FIG. 20D, the resistance detection circuit324 is formed of a half-bridge circuit in which resistances r1 and r4related to the resistance type sensors 31-1 and 31-4 and the tworesistances Rref for references are assembled.

Next, respective output voltages V1 to V4 of the resistance detectioncircuits 321 to 324, formed in the phases 1 to 4, will be described withreference to FIG. 20A to FIG. 20D.

The output voltage V1 of the resistance detection circuit 321 in thephase 1 is expressed as follows (see FIG. 20A) when V is a voltagesupplied to the power supply terminal 324.

$\begin{matrix}{{V\; 1} = {\frac{2 \cdot {Rref}}{( {{r\; 1} + {r\; 3}} ) + {2 \cdot {Rref}}} \cdot V}} & ( {{Expression}\mspace{14mu} 19} )\end{matrix}$

Here, if it is assumed that ΔR1 and ΔR3 are extremely smaller than R1,R3, and Rref, the Expression 19 can be expressed as follows.

$\begin{matrix}{{V\; 1} = {\frac{2 \cdot {Rref} \cdot V}{( {{R\; 1} + {R\; 3}} ) + {2 \cdot {Rref}}}\lbrack {1 - \frac{{\Delta \; R\; 1} + {\Delta \; R\; 3}}{( {{R\; 1} + {R\; 3}} ) + {2 \cdot {Rref}}}} \rbrack}} & ( {{Expression}\mspace{14mu} 20} )\end{matrix}$

Although this equation is somewhat complex, all of the quantities arefixed numbers except ΔR1 and ΔR3. It is supposed that A1 and B1 arefixed numbers, the output voltage V1 can be expressed by the followingprimary expression.

V1=A1−B1·(ΔR1+ΔR3)  (54)

That is, the output voltage V1 of the resistance detection circuit 321can be derived by measuring a voltage depending on a sum (i.e., a resultof sum) of variations ΔR1 and ΔR3 of the resistance values of theresistances r1 and r3 of the resistance type sensors 31-1 and 31-3.Also, values of A1 and B1 can be arbitrarily set. Hence, by focusing onthe variations of the voltages, the equation (54) can be expressed asthe following equation (55).

V1∝ΔR1+ΔR3  (55)

Next, for simplification, this proportional coefficient is set to 1 toexpress the output voltage V1 as follows.

V1=ΔR1+ΔR3  (56)

Next, the output voltage V2 of the resistance detection circuit 322 inthe phase 2 is given as follows (see FIG. 20B).

$\begin{matrix}{{V\; 2} = {\frac{{- ( {{r\; 3} - {r\; 2}} )} \cdot {Rref}}{( {{r\; 3} + {R\; {ref}}} ) \cdot ( {{r\; 2} + {R\; {ref}}} )} \cdot V}} & ( {{Expression}\mspace{14mu} 21} )\end{matrix}$

This can be arranged in an equation that becomes extremely complexexpression. However, it is assumed that R3 and R2 are equal, and inaddition, as described above, it is also assumed that ΔR1 and ΔR3 areextremely smaller than R1, R3, and Rref. By such assumptions, theExpression 21 enables the output voltage V2 to be expressed by thefollowing primary expression to be similar to the case of the phase 1.

V2=A2−B2·(ΔR3−ΔR2)  (57)

That is, the output voltage V2 of the resistance detection circuit 322can be obtained by measuring the voltage depending on the difference(i.e., a result of subtraction) of the variations ΔR3 and ΔR2 of theresistance values of the resistors r3 and r2 of the resistance typesensors 31-3 and 31-32. Likewise, the values of A2 and B2 can bearbitrarily set and the equation (57) can be further simplified andgiven as follows.

V2=ΔR3−ΔR2  (58)

The resistance detection circuit 322 (see FIG. 20C) in the subsequentphase 3 is similar to the resistance detection circuit 321 in thephase 1. Moreover, the resistance detection circuit 324 (see FIG. 20D)in the phase 4 is similar to the resistance detection circuit 322 in thephase 2.

Therefore, the output voltages V1 to V4, output from the resistancedetection circuit 321 for respective phases, are summarized as follows.

V1=ΔR1+ΔR3  (59)

V2=ΔR3−ΔR2  (60)

V3=ΔR2+ΔR4  (61)

V4=−ΔR4+ΔR1  (62)

That is, the detection circuit forming unit 32 selects two predeterminedresistance sensors from four resistance type sensors 31-1 to 31-4 foreach phase. Moreover, for the purpose of performing adding orsubtracting operations for resistance changes of the selected resistancetype sensors, the resistance detection circuits 321 to 324 are formed ofeither the half-bridge circuit or the full-bridge circuit.

Also, while the detection circuit forming unit 32 has been describedheretofore to be formed of the bridge circuits, any circuit capable ofconverting resistance changes of two or more resistance type sensorsinto voltages may be applicable. For example, even a current voltageconverter circuit, in which fixed current flows through the resistancetype sensor, is capable of converting the resistance into voltage, and aresistance ladder circuit well utilized as a DA (Digital to Analog)converter may be applicable.

The detection circuit forming unit 32 may preferably include a circuitthat can convert a sum of or a difference of the resistance changes oftwo or more resistance type sensors into a sum of or a difference ofvoltages.

In case of embodiment 4, in some cases, a subtraction result betweenmutual resistance values is converted into a voltage value. Hence, thefull-bridge circuit is particularly most suited in light of the cost andaccuracy.

In addition, the detection circuit forming unit 32 may preferably have atransistor and an amplifier present at a subsequent stage.

The measuring unit 33 sequentially acquires and measures the outputvoltages V1 to V4 output from the resistance type sensors 321 to 324 areformed of the detection circuit forming unit 32. Specifically, apredetermined signal process such as amplification or AD conversion isperformed for the acquired output voltages V1 to V4.

To this end, the measuring unit 33 includes, for example, amplifyingcircuits (not illustrated), which include computing amplifiers(operation amplifiers) for amplifying the output voltages V1 to V4output from the resistance detection circuits 321 to 324, and ADconverters (not illustrated) for performing AD conversions of theoutputs of the amplifying circuits, respectively.

The computing unit 34 linearly combines the output voltages V1 to V4acquired and output by the measuring unit 33, after output from thedetection circuit forming unit 32, by performing a predeterminedcomputation. Based on such linear combination, the computing unit 34performs computations to obtain the outputs on respective axes (supposedto be X-axis, Y-axis, and Z-axis) and computation results are output.

Here, as described above, the measuring unit 33 acquires the outputvoltages V1 to V4 from the detection circuit forming unit 32 and allowsthe AD conversion circuits to perform AD conversions to output digitalsignals. To this end, computations of the computing unit 34 for theoutputs on the respective axes can be achieved by a CPU (CentralProcessing Unit) or software of a microcomputer.

Concrete Example 1

Next, a concrete example of embodiment 4 according to the presentinvention will be described.

First, Concrete example 1 is described.

Concrete example 1 is a case where in embodiment 4 illustrated in FIG.19, magnetic resistance type sensors having the following outputcharacteristics are applied as the resistance type sensors 31-1 to 31-4.

ΔR1=X+Z=kx·Bx+kz·Bz  (63)

ΔR2=X−Z=kx·Bx−kz·Bz  (64)

ΔR3=Y+Z=ky·By +kz·Bz  (65)

ΔR4=Y−Z=ky·By −kz·Bz  (66)

Here, Bx, By, and Bz represent respective axis component values of3-axis (X-axis, Y-axis, and Z-axis) magnetic fields orthogonal to eachother. Moreover, kx, ky, and kz correspond to sensitivities of thesensors in general, and in this example, indicate transformationconstants from the magnetic fields to the resistance values.Accordingly, X, Y, and Z represent the component values of therespective magnetic fields in terms of dimensions of resistances.

In addition, the magnetic resistance type sensors, having the outputcharacteristics indicated by the equations (63) to (66), have concreteinternal configurations that are known in the art as disclosed in JP2002-71381 A or the like.

A study will be conducted as to a case where the time-sharing process issequentially performed on the sensors, each having the characteristicsdescribed above, in an order of a first magnetic resistance type sensor,a second magnetic resistance type sensor, . . . , and so on.

To describe in detail, this is given as follows.

Phase 1=V1(Time sharing)=ΔR1=X+Z  (67)

Phase 2=V2(Time sharing)=ΔR2=X−Z  (68)

Phase 3=V3(Time sharing)=ΔR3=Y+Z  (69)

Phase 4=V4(Time sharing)=ΔR4=Y−Z  (70)

In such signal processing, it becomes possible to measure all ofquantities on left sides of the above equations (67) to (70). Thus, byusing the results, the component values X, Y, and Z of the magneticfields on respective axes are obtainable in the following equations.

X-axis Magnetic Field: X=½·(V1(Time sharing)+V2(Time sharing))  (71)

Y-axis Magnetic Field: Y=½·(V3(Time sharing)+V4(Time sharing))  (72)

Z-axis Magnetic Field: Z=¼·(V1(Time sharing)−V4(Time sharing))+V3(Timesharing)−V4(Time sharing)  (73)

In contrast, in Concrete example 1 according to embodiment 4, thedetection circuit forming unit 32 forms the resistance detectioncircuits 321 to 324 as illustrated in FIG. 20A to FIG. 20D, in order oftime. The measuring unit 33 measures the output voltages V1 to V4 of theresistance detection circuits 321 to 324 in synchronization withrespective orders of time. As a result, the output voltages V1 to V4 ofthe detection circuit forming unit 32 in the respective phases arederived from the equations (59) to (62), as follows.

Phase 1: V1=ΔR1+ΔR3=X+Y+2Z  (74)

Phase 2: V2=ΔR3−ΔR2=−X+Y+2Z  (75)

Phase 3: V3=ΔR2+ΔR4=X+Y−2Z  (76)

Phase 4: V4=−ΔR4+ΔR1=X−Y+2Z  (77)

By inversely solving these relational expressions, the computing unit 34can compute the component values X, Y, and Z of the magnetic fields onthe respective axes by using the output voltages V1 to V4 on the leftsides of the equations (74) to (77).

In particular, such computations are performed as follows.

X-axis Magnetic Field: X=¼·(V1−V2+V3+V4)  (78)

Y-axis Magnetic Field: Y=¼·(V1+V2+V3−V4)  (79)

Z-axis Magnetic Field: Z=⅛·(V1+V2−V3+V4)  (80)

As will be apparent from the foregoing description, Bx, By, Bz to X, Y,Z may not necessarily be the component values of the 3-axe magneticfields, and original physical quantities are not limited to the magneticfields, as long as the sensors satisfy the equations (63) to (66) withrespect to the four resistance type sensors.

Further, the resistance detection circuits 321 to 324 in respectivephases of FIG. 20A to FIG. 20D are not the one and only configurations.As a first example, no compatibility between the respective phases losegenerality. As a second example, even when the resistances r1 to r4related to the resistance type sensors 31-1 to 31-4, respectively, arereplaced with the reference resistance Rref in all of the four phases,an exactly similar result can be obtained. Likewise, even when theresistance type sensors to be selected between the respective phases arereplaced with each other, the equations (74) to (77) can be satisfied.

More specifically, the resistance detection circuits for converting theresistance into the voltage are not limited to the bridge circuits. Anytype of resistance detection circuit that can satisfy the relationshipsof the equations (78) to (80) may be applicable to the device accordingto the present invention.

Incidentally, the above equations (74) to (77) are very similar toExpression 9 disclosed in WO 2008/032741. Expression 9 is cited asfollows, without change.

(α)=A+C=Hx+Hy+2Hz+√2n  (81)

(β)=A+D=Hx−Hy+2Hz+√2n  (82)

(γ)=B+D=−Hx−Hy+2Hz+√2n  (83)

(δ)=B+C=−Hx+Hy+2Hz+√2n  (84)

In the above expressions, the equation (74) and the equation (81) aresimilar to (α) (except for noise n). The equation (75) and the equation(76) are similar to those in which the equation (82) and the equation(84) are inversed. Substitution between the equation (75) and theequation (76) can be arbitrary, as described above, and all of essentialmeanings are similar.

Meanwhile, the equation (76) and the equation (83) have different signs.Such a difference in sign comes from a difference in that a magneticresistance type sensor, as disclosed in the Patent document describedabove, is used for a technical object of the present invention. That is,this is an inevitable difference. However, since the sign can beinverted in the invention disclosed in WO 2008/032741, the definition of(γ) as expressed below again allows the equation (76) and the equation(83) to be similar.

(γ)=−B−D  (85)

Next, a study will be conducted as to what extent the SN ratio isimproved in Concrete example 1 of embodiment 4.

To this end, signal components and noise components for the respectivephases in the case of the time-sharing process that is a comparisonobject of Concrete example 1 are defined as follows.

Phase 1=V1(Time sharing)=ΔR1=X+Z±Ns±Na  (86)

Phase 2=V2(Time sharing)=ΔR2=X−Z±Ns±Na  (87)

Phase 3=V3(Time sharing)=ΔR3=Y+Z±Ns±Na  (88)

Phase 4=V4(Time sharing)=ΔR4=Y−Z±Ns±Na  (89)

Here, a first sign in each equation is derived from the time-sharingprocess. A second sign is led from the equations (83) to (66). Moreover,it is supposed that ±Ns designates noise resulting from the resistancetype sensor in each phase, and ±Na designates noise occurring at themeasuring unit 33 in each phase. In addition, it is supposed that bothof these noises take what is called white noise, that is, a fixed valuefor all frequency bands with respective noises remaining uncorrelated toeach other.

To acquire a magnetic field on each axis, when applying the equations(71) to (73) to the output voltages including noises in respectivephases indicated in the equations (86) to (89), the followingexpressions are obtainable.

X-axis Magnetic Field (including noise): X′=½·(2X±√2Ns±√2Na)  (90)

Y-axis Magnetic Field (including noise): Y′=½·(2Y±√2Ns±√2Na)  (91)

Z-axis Magnetic Field (including noise): Z′=¼·(4Z±2Ns±2Na)  (92)

Meanwhile, the signal components and the noise components for therespective phases are defined as expressed in the equations (86) to(89). When the signal processing of Concrete example 1 according to thepresent invention, that is, FIG. 2 and the equations (74) to (77) areapplied, the signal components and the noise components in respectivephases can be expressed as follows.

Phase 1: V1=ΔR1+ΔR3=(X+Z±Ns)+(Y+Z±Ns)±Na=X+Y+2Z±√2Ns±Na  (93)

Phase 2: V2=ΔR3−ΔR2=(Y+Z±Ns)−(X−Z±Ns)±Na=−X+Y+2Z±√2Ns±Na  (94)

Phase 3: V3=ΔR2+ΔR4=(X−Z±Ns)+(Y−Z±Ns)±Na=X+Y−2Z±√2Ns±Na  (95)

Phase 4: V4=−ΔR4+ΔR1=−(Y−Z±Ns)+(X+Z±Ns)±Na=X−Y+2Z±√2Ns±Na  (96)

One measuring unit 33 is provided, and hence, in the equations (93) to(96), one ±Na for each phase is added to a sum of two sensor signalsincluding noises. In addition, since sensor noises are uncorrelated toeach other, the equations (93) to (96) can be modified as second lines.

When the same computations as those for V1 to V4, described in the aboveequations (78) to (89), are performed for the equations (93) to (96),the magnetic fields X′, Y′, Z′ on the respective axes including noisesare computed as follows.

X-axis Magnetic Field (with Noise): X′=¼·(4X±2√Ns±Na)  (97)

Y-axis Magnetic Field (with Noise): Y′=¼·(4Y±2√2Ns±Na)  (98)

Z-axis Magnetic Field (with Noise): Z′=⅛·(8Z±2√2Ns±2Na)  (99)

When comparing the equations (97) to (99) to the equations (90) to (92),it turns out that the SN ratios vary as follows.

SN Ratio on X-axis: SN ratio for Ns is same. SN ratio for Na is improvedby 2 times.

SN Ratio on Y-axis: SN ratio for Ns is same. SN ratio for Na is improvedby 12 times.

SN Ratio on Z-axis: SN ratio for Ns is improved by 12 times. SN ratiofor Na is improved by 2 times.

Here, noise Ns, caused by the resistance type sensor, is extremely smallto be ignored and only Na caused by the measuring unit 33 is taken intoconsideration. Further, in consideration of the fact that thetime-sharing process needs three phases and Concrete example 1 ofembodiment 4 needs four phases, a total time-sharing process period forall phases (i.e., one cycle) on both is adjusted in alignment. That is,a processing period for one phase of Concrete example according toembodiment 4 is reduced to a period of ¾ times the time-sharing process.

The SN ratio for Na in this situation becomes √3/2 times the above SNratio on all of the axes. That is, the improvements are achieved for allof the axes as expressed below.

SN Ratio on X-axis: SN ratio for Na is improved by √6/2 times(approximately 1.22 times).

SN Ratio on Y-axis: SN ratio for Na is improved by √6/2 times(approximately 1.22 times).

SN Ratio on Z-axis: SN ratio for Na is improved by √3 times(approximately 1.73 times).

Accordingly, when noise caused by the resistance type sensor isextremely small and supposed to be ignored as compared to noiseresulting from the measuring unit 33, Concrete example 1 of embodiment 4exhibits the maximum effect.

Concrete Example 2

Next, Concrete example 2 according to embodiment 4 will be described.

According to Concrete example 2, in embodiment 4 illustrated in FIG. 19,magnetic resistance type sensors having the following outputcharacteristics are applied as the resistance type sensors 31-1 to 31-4.

ΔR1=X+Z+Yx=kx·Bx+kz·Bz+kyx·By  (100)

ΔR2=X−Z+Yx=kx·Bx−kz·Bz+kyx·By  (101)

ΔR3=Y+Z+Xy=ky·By +kz·Bz+kxy·Bx  (102)

ΔR4=Y−Z+Xy=ky·By−kz·Bz+kxy·Bx  (103)

In the equations (100) to (103), the parameters described in theequations (63) to (66) have the same meanings as those described. Newlydefined kxy and kyx are what is called cross axis sensitivity, where kxyrepresents sensitivity given to the Y-axis resistance type sensor by theX-axis magnetic field, and kyx represents sensitivity given to theX-axis resistance type sensor by the Y-axis magnetic field. Accordingly,Concrete example 1 of embodiment 4 described above represents a specialcase (i.e., a case of the absence of cross axis sensitivity) of Concreteexample 2 of embodiment 4.

Moreover, a concrete internal configuration of the magnetic resistancesensor, having the output characteristics as illustrated in theequations (100) to (103), is known in the art as disclosed in JP2002-71381 and the like.

According to Concrete example 2, in a way similar to Concrete example 1,the detection circuit forming unit 32 forms the resistance typedetection circuits 321 to 324 as illustrated in FIG. 20A to FIG. 20D intime order. The measuring unit 33 measures the output voltages V1 to V4of the resistance type detection circuits 321 to 324 in synchronizationwith respective time orders. As a result, the output voltages vary inrespective phases for the three-axis magnetic fields as expressed asfollows.

Phase 1: V1=ΔR1+ΔR3=(X+Yx)+(Y+Xy)+2Z  (104)

Phase 2: V2=ΔR3−ΔR2=−(X+Yx)+(Y+Xy)+2Z  (105)

Phase 3: V3=ΔR2+ΔR4=(X+Yx)+(Y+Xy)−2Z  (106)

Phase 4: V4=−ΔR4+ΔR1=(X+Yx)−(Y+Xy)+2Z  (107)

As apparent from the equations (100) to (103) for the outputcharacteristics, these relational expressions merely include expressionsin which X in Concrete example 1 of embodiment 4 is replaced with X+Yxand Y by Y+Xy. Accordingly, by inversely solving the equations (100) to(103), it is made possible for the computing unit 34 to compute X+Yx,Y+Xy, and Z, respectively.

To write these concretely, these are given as follows.

X+Yx=¼·(V1−V2+V3+V4)  (108)

Y+Xy=¼·(V1+V2+V3−V4)  (109)

Z=⅛·(V1+V2−V3+V4)  (110)

As apparent from the foregoing description, Bx, By and Bz to X, Y, Z maynot particularly be the magnetic component values. The original physicalquantities is not limited to the magnetic fields, any sensor ofsatisfying the output characteristics of the equations (100) to (103)may be provided, as to the four resistance type sensors.

In view of these results of the equations (108) to (110), the Z-axismagnetic field has been already acquired by the equation (110). Inpractice, this is exactly the same expression as that of Concreteexample 1 according to embodiment 4. That is, for the improvement of theSN ratio, the exactly same conclusion as that of Concrete example 1 isestablished.

Meanwhile, in order to calculate the X-axis magnetic field and theY-axis magnetic field, by substituting the results of the equations(108) to (110) into the equations (100) to (103) to erase X, Y, Xy andYx, the following two equations are derived.

V1−V2+V3+V4=4(X+Yx)=4(kx·Bx+kyx·By)=P1  (111)

V1+V2+V3−V4=4(Y+Xy)=4(kxy·Bx+ky·By)=P2  (112)

All left sides of these equations (111) and (112) represent quantities(P1 and P2) that are acquired upon measuring. In addition, all of kx,ky, kxy, and kyx are constants that can be obtained beforehand.Accordingly, unknown quantities in the equations (111) and (112) areonly Bx and By that can be obtained.

To describe in detail with the use of P1 and P2 defined in the equations(111) and (112), the following expressions are given.

$\begin{matrix}{{{Bx} = \frac{{{{{ky} \cdot P}\; 1} - {kyx}}{{\cdot P}\; 2}}{{{kx} \cdot {ky}} - {{kxy} \cdot {kyx}}}}\mspace{14mu} {{By} = \frac{{{{kx} \cdot P}\; 1} - {{{kxy} \cdot P}\; 2}}{{{kx} \cdot {ky}} - {{kxy} \cdot {kyx}}}}} & ( {{Expression}\mspace{14mu} 22} )\end{matrix}$

According to Concrete example 2 of embodiment 4 described heretofore, itbecomes possible to compute the magnetic field on each axis of the threeaxes for the magnetic resistance type sensors in which cross axissensitivities are present.

According to embodiment 4 according to the present invention, asdescribed above, the detection circuit forming unit 32 selects the twopredetermined resistance type sensors from among the four resistancetype sensors 31-1 to 31-4 in the measurement of the physical quantities.The predetermined resistance detection circuits 321 to 324 includingsuch selected two resistance type sensors are configured.

In embodiment 4, further, the attempt has been made to performcomputations including linear combination for the output voltages V1 toV2 given from the detection circuit forming unit 32, so as to acquirethe outputs on the X-axis, the Y-axis, and the Z-axis.

In embodiment 4, therefore, when plural resistance detection circuitsare needed, component elements are commonly used for the miniaturizationof a circuit size or the like, and in addition, the improvement of theSN ratio can be achieved.

REFERENCE SIGNS LIST

-   1-1 to 1-4 sensor-   2, 2A signal inverting unit-   2-1 to 2-4 switch-   3 combination unit-   4 measuring unit-   4-1 amplifying unit-   4-2 AD converting unit-   5 computing unit-   11-1 to 11-3 acceleration sensor-   11-4 to 11-6 magnetic sensor-   11-7 to 11-10 sensor-   12 signal amplifying unit-   12-1 to 12-4 signal amplifying circuit-   13-1 to 13-10 switch-   14 combination unit-   15 measuring unit-   16 computing unit-   21-1 to 21-n sensor-   22, 22A signal inverting unit-   22-1 to 22-n amplifying switch-   22-1 a to 22-na switch group-   22-A amplifier-   23 combination unit-   24 measuring unit-   25 computing unit-   31-1 to 31-4 resistance type sensor-   32 detection circuit forming unit-   33 measuring unit-   34 computing unit-   321 to 324 resistance detection circuit

1. A signal processing device comprising: a combination unit configuredto combine a plurality of element signals based on a plurality ofphysical quantity signals including signal components in accordance withdesired physical quantities, respectively, by the number of times equalto or greater than a number of the plurality of physical quantitysignals, and to output combined signals different from each other; ameasuring unit configured to sequentially receive the combined signalsoutput from the combination unit; and a computing unit configured tocompute signal components based on the desired physical quantities fromsignals that are generated based on the combined signals sequentiallyoutput from the measuring unit.
 2. The signal processing deviceaccording to claim 1, wherein the computing unit linearly combines thecombined signals sequentially output from the measuring unit, andcomputes the signal components based on the desired physical quantitiesfrom results of linear combination.
 3. The signal processing deviceaccording to claim 2, wherein conversion of the computing unit forlinearly combining and conversion of the combination unit for definingthe combined signals are inverse linear conversions from each other. 4.The signal processing device according to claim 1, wherein the number ofthe plurality of physical quantity signals is equal to or greater thanfour.
 5. The signal processing device according to claim 3, wherein thenumber of times the combination unit outputs the combined signals isequal to the number of the plurality of physical quantity signals, andthe inverse linear conversions have a relationship of an inverse matrixfrom each other.
 6. The signal processing device according to claim 1,further comprising a signal inverting unit configured to receive theplurality of physical quantity signals, to output a predetermined signalof the plurality of element signals respectively corresponding to thephysical quantity signals as an inverted signal in which a physicalquantity signal is inverted as an element signal, and to output aremaining signal of the plurality of element signals as a non-invertedsignal in which the physical quantity signal is not inverted as theelement signal, wherein the combination unit combines the invertedsignal and the non-inverted signal by the number of times equal to orgreater than the number of the plurality of physical quantity signals.7. The signal processing device according to claim 3, wherein the signalinverting unit receives the plurality of physical quantity signals: toperform an amplification process of amplifying one or more signals ofthe plurality of physical quantity signals at a predeterminedamplification rate, and not amplifying or amplifying a remaining signalof the plurality of physical quantity signals at another amplificationrate different from the predetermined amplification; and to perform aninversion process of inverting the physical quantity signal of apredetermined signal of the plurality of physical quantity signals tobecome the inverted signal, and not inverting the physical quantitysignal of a remaining signal to become a non-inverted signal, whereinthe signal inverting unit output signals of the plurality of physicalquantity signals in which the amplification process and the inversionprocess are respectively performed, as the plurality of element signals,and wherein the combination unit combines the plurality of elementsignals including the inverted signal of the plurality of elementsignals and the element signal including the non-inverted signals of theplurality of element signals by the number of times equal to or greaterthan the number of the plurality of physical quantity signals, andoutputs the combined signals.
 8. The signal processing device accordingto claim 7, wherein the signal inverting unit amplifies a signal havinga minimum SN (Signal to Noise) ratio of the plurality of element signalsrespectively corresponding to the plurality of physical quantity signalsat a predetermined amplification rate greater than 1.0 in an absolutevalue, and does not amplify or amplifies a remaining signal at anotheramplification rate having an absolute value smaller than the absolutevalue of the predetermined amplification rate.
 9. The signal processingdevice according to claim 7, wherein the signal inverting unit outputs asignal having a minimum SN ratio of the plurality of element signalsrespectively corresponding to the plurality of physical quantity signalswithout change, and amplifies a remaining signal at an amplificationrate smaller than 1.0 in an absolute value.
 10. The signal processingdevice according to claim 7, wherein the number of the plurality ofphysical quantity signals is equal to or greater than N, where N is aninteger equal to or greater than 5, and wherein the signal invertingunit inverts and amplifies a predetermined signal by ((N/2)−1) times tobecome the inverted signal.
 11. The signal processing device accordingto claim 1, wherein the computing unit computes a signal component basedon the desired physical quantity based on linearly combined data inwhich the combined signal output from the combination unit and a givencoefficient are linearly combined, and wherein the coefficient does notinclude 0 and has the absolute values all of which are equal.
 12. Thesignal processing device according to claim 1, wherein the plurality ofphysical quantity signals include signals output from at least two typesof sensors for measuring different physical quantities.
 13. The signalprocessing device according to claim 1, wherein the plurality ofphysical quantity signals include signals output from two or moresensors, and the two or more sensors include a sensor having at leastone of sensitivity and the SN ratio different from the sensitivity orthe SN ratio of the other sensor.
 14. A signal processing devicecomprising: a plurality of resistance type sensors configured to detectpredetermined physical quantities, and having resistances varyingdepending on detected physical quantities; a detection circuit formingunit configured to select two or more predetermined resistance typesensors from the plurality of resistance type sensors, and to form apredetermined resistance detection circuit including the two or moreresistance type sensors that have been selected; a measuring unitconfigured to sequentially receive output signals from the resistancedetection circuit that has been formed; and a computing unit configuredto compute, including an operation of linearly combining the outputsignals sequentially output from the measuring unit to compute thephysical quantities.
 15. The signal processing device according to claim14, wherein the detection circuit forming unit selects two or moreresistance types that are different for each time period from theplurality of resistance type sensors, and forms the predeterminedresistance detection circuit including the two or more resistance typesensors that have been selected.
 16. The signal processing deviceaccording to claim 15, wherein the plurality of resistance type sensorsinclude three or more resistance type sensors.
 17. The signal processingdevice according to claim 14, wherein the detection circuit forming unitselects two or more resistance type sensors that detect predeterminedphysical quantities independent from each other from the plurality ofresistance type sensors, and forms the predetermined resistancedetection circuit including the two or more resistance type sensors thathave been selected.
 18. The signal processing device according to claim14, wherein the two or more resistance type sensors that have beenselected are sensors that simultaneously detect either physicalquantities of two or more axes orthogonal to each other or two or moretypes of physical quantities and change resistances depending ondetected values.
 19. The signal processing device according to claim 14,wherein the computing unit computes components of the predeterminedphysical quantities on either two axes orthogonal to each other or threeaxes.
 20. The signal processing device according to claim 14, whereinthe predetermined physical quantities are magnetic fields.
 21. Thesignal processing device according to claim 14, wherein the resistancedetection circuits are made of either half-bridge circuits orfull-bridge circuits, and wherein the detection circuit forming unitalternately forms the half-bridge circuits and the full-bridge circuits.22. The signal processing device according to claim 14, wherein thecomputing unit linearly combines the output signals from the resistancedetection circuits sequentially received by the measuring unit andcoefficients corresponding to the output signals from the resistancedetection circuits to generate linearly combined data.
 23. The signalprocessing device according to claim 2, wherein the number of theplurality of physical quantity signals is equal to or greater than four.24. The signal processing device according to claim 2, furthercomprising a signal inverting unit configured to receive the pluralityof physical quantity signals, to output a predetermined signal of theplurality of element signals respectively corresponding to the physicalquantity signals as an inverted signal in which a physical quantitysignal is inverted as an element signal, and to output a remainingsignal of the plurality of element signals as a non-inverted signal inwhich the physical quantity signal is not inverted as the elementsignal, wherein the combination unit combines the inverted signal andthe non-inverted signal by the number of times equal to or greater thanthe number of the plurality of physical quantity signals.
 25. The signalprocessing device according to claim 2, wherein the computing unitcomputes a signal component based on the desired physical quantity basedon linearly combined data in which the combined signal output from thecombination unit and a given coefficient are linearly combined, andwherein the coefficient does not include 0 and has the absolute valuesall of which are equal.
 26. The signal processing device according toclaim 2, wherein the plurality of physical quantity signals includesignals output from at least two types of sensors for measuringdifferent physical quantities.
 27. The signal processing deviceaccording to claim 2, wherein the plurality of physical quantity signalsinclude signals output from two or more sensors, and the two or moresensors include a sensor having at least one of sensitivity and the SNratio different from the sensitivity or the SN ratio of the othersensor.
 28. The signal processing device according to claim 15, whereinthe detection circuit forming unit selects two or more resistance typesensors that detect predetermined physical quantities independent fromeach other from the plurality of resistance type sensors, and forms thepredetermined resistance detection circuit including the two or moreresistance type sensors that have been selected.
 29. The signalprocessing device according to claim 15, wherein the two or moreresistance type sensors that have been selected are sensors thatsimultaneously detect either physical quantities of two or more axesorthogonal to each other or two or more types of physical quantities andchange resistances depending on detected values.
 30. The signalprocessing device according to claim 15, wherein the computing unitcomputes components of the predetermined physical quantities on eithertwo axes orthogonal to each other or three axes.
 31. The signalprocessing device according to claim 15, wherein the predeterminedphysical quantities are magnetic fields.
 32. The signal processingdevice according to claim 15, wherein the resistance detection circuitsare made of either half-bridge circuits or full-bridge circuits, andwherein the detection circuit forming unit alternately forms thehalf-bridge circuits and the full-bridge circuits.
 33. The signalprocessing device according to claim 15, wherein the computing unitlinearly combines the output signals from the resistance detectioncircuits sequentially received by the measuring unit and coefficientscorresponding to the output signals from the resistance detectioncircuits to generate linearly combined data.